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Published in: Journal of Intelligent Manufacturing 4/2023

10-01-2022

Casting plate defect detection using motif discovery with minimal model training and small data sets

Authors: Amanjeet Singh Bhatia, Rado Kotorov, Lianhua Chi

Published in: Journal of Intelligent Manufacturing | Issue 4/2023

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Abstract

Manufacturers are increasingly applying machine and deep learning to automate production quality monitoring to save time and costs. The most widely used approach is Convolutional Neural Network (CNN) trained to detect quality issues in production output images. While the approach achieves high accuracy, many companies face challenges implementing it. Many manufacturers lack both the big data sets required for machine and deep learning model training and the data scientists having the domain knowledge to build and run complex models. Today manufacturers have implemented lean manufacturing and six sigma quality controls which result in small defect samples that are not sufficient for modeling. Some manufacturers also change the production outputs frequently which does not permit enough time for data collection for model building. In this paper, we propose two motif discovery based approaches that work within the constraints of modern manufacturing. The first approach is programmatic motif discovery learning patterns from small data samples. The second approach is a self-service visual motif discovery that is simple and intuitive for engineers not versed in data science. We compare the proposed approaches with a CNN and conclude that our proposed methods achieve higher accuracy, have significantly lower computational costs, and empower engineers to do it themselves.

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Literature
go back to reference Aguiar, P. R., Da Silva, R. B., Gerônimo, T. M., Franchin, M. N., & Bianchi, E. C. (2017). Estimating high precision hole diameters of aerospace alloys using artificial intelligence systems: a comparative analysis of different techniques. Journal of the Brazilian Society of Mechanical Sciences and Engineering, 39(1), 127–153. https://doi.org/10.1007/s40430-016-0525-7.CrossRef Aguiar, P. R., Da Silva, R. B., Gerônimo, T. M., Franchin, M. N., & Bianchi, E. C. (2017). Estimating high precision hole diameters of aerospace alloys using artificial intelligence systems: a comparative analysis of different techniques. Journal of the Brazilian Society of Mechanical Sciences and Engineering, 39(1), 127–153. https://​doi.​org/​10.​1007/​s40430-016-0525-7.CrossRef
go back to reference Al-Kharaz, M., Ananou, B., Ouladsine, M., Combal, M., & Pinaton, J., (2019, October). Quality Prediction in Semiconductor Manufacturing processes using multilayer perceptron feedforward artificial neural network. In 2019 8th international conference on systems and control (ICSC) (pp. 423–428). IEEE https://doi.org/10.1109/ICSC47195.2019.8950664. Al-Kharaz, M., Ananou, B., Ouladsine, M., Combal, M., & Pinaton, J., (2019, October). Quality Prediction in Semiconductor Manufacturing processes using multilayer perceptron feedforward artificial neural network. In 2019 8th international conference on systems and control (ICSC) (pp. 423–428). IEEE https://​doi.​org/​10.​1109/​ICSC47195.​2019.​8950664.
go back to reference Banadaki, Y., Razaviarab, N., Fekrmandi, H., & Sharifi, S. (2020). Toward Enabling a reliable quality monitoring system for additive manufacturing process using deep convolutional neural networks. arXiv:2003.08749. Banadaki, Y., Razaviarab, N., Fekrmandi, H., & Sharifi, S. (2020). Toward Enabling a reliable quality monitoring system for additive manufacturing process using deep convolutional neural networks. arXiv:​2003.​08749.
go back to reference Goutte, C., & Gaussier, E. (2005). A probabilistic interpretation of precision, recall and F-score, with implication for evaluation. In Losada, D. E., Fernández-Luna, J. M. (eds) Advances in information retrieval. ECIR 2005. Lecture Notes in Computer Science (Vol. 3408). Springer, Berlin, Heidelberg. https://doi.org/10.1007/978-3-540-31865-1_25. Goutte, C., & Gaussier, E. (2005). A probabilistic interpretation of precision, recall and F-score, with implication for evaluation. In Losada, D. E., Fernández-Luna, J. M. (eds) Advances in information retrieval. ECIR 2005. Lecture Notes in Computer Science (Vol. 3408). Springer, Berlin, Heidelberg. https://​doi.​org/​10.​1007/​978-3-540-31865-1_​25.
go back to reference Lin, Y., McCool, M. D., & Ghorbani, A. A. (2010). Time series motif discovery and anomaly detection based on subseries join. IAENG International Journal of Computer Science, 37(3), 259–271. Lin, Y., McCool, M. D., & Ghorbani, A. A. (2010). Time series motif discovery and anomaly detection based on subseries join. IAENG International Journal of Computer Science, 37(3), 259–271.
go back to reference Lonardi, J. L. E. K. S., & Patel, P. (2002). Finding motifs in time series. In Proceedings of the 2nd workshop on temporal data mining (pp. 53–68). Lonardi, J. L. E. K. S., & Patel, P. (2002). Finding motifs in time series. In Proceedings of the 2nd workshop on temporal data mining (pp. 53–68).
go back to reference Luckow, A., Kennedy, K., Ziolkowski, M., Djerekarov, E., Cook, M., Duffy, E., Schleiss,M., Vorster, B., Weill, E., Kulshrestha, A., & Smith, M. C. (2018, December). Artificial intelligence and deep learning applications for automotive manufacturing. In 2018 IEEE international conference on Big Data (Big Data) (pp. 3144–3152). IEEE https://doi.org/10.1109/BigData.2018.8622357. Luckow, A., Kennedy, K., Ziolkowski, M., Djerekarov, E., Cook, M., Duffy, E., Schleiss,M., Vorster, B., Weill, E., Kulshrestha, A., & Smith, M. C. (2018, December). Artificial intelligence and deep learning applications for automotive manufacturing. In 2018 IEEE international conference on Big Data (Big Data) (pp. 3144–3152). IEEE https://​doi.​org/​10.​1109/​BigData.​2018.​8622357.
Metadata
Title
Casting plate defect detection using motif discovery with minimal model training and small data sets
Authors
Amanjeet Singh Bhatia
Rado Kotorov
Lianhua Chi
Publication date
10-01-2022
Publisher
Springer US
Published in
Journal of Intelligent Manufacturing / Issue 4/2023
Print ISSN: 0956-5515
Electronic ISSN: 1572-8145
DOI
https://doi.org/10.1007/s10845-021-01880-2

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