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Published in: Metallurgical and Materials Transactions A 6/2016

22-03-2016

Characteristics of Reactive Ni3Sn4 Formation and Growth in Ni-Sn Interlayer Systems

Authors: Adrian Lis, Christoph Kenel, Christian Leinenbach

Published in: Metallurgical and Materials Transactions A | Issue 6/2016

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Abstract

The near-isothermal growth and formation of Ni3Sn4 intermetallic compounds (IMC) in Ni-Sn interlayer systems was studied in the solid state at 473 K (200 °C) and under solid–liquid conditions at 523 and 573 K (250 °C and 300 °C) from an initial state of a few seconds. Scalloped solid-state IMC formation was mainly driven by grain boundary diffusion of Ni through the IMC layer combined with the grain coarsening of the IMC layer. Under solid–liquid conditions, the formation of faceted and needle-shaped Ni3Sn4 grains as well as an atypical IMC growth behavior with similar parabolic growth constants for 523 K and 573 K (250 °C and 300 °C) was observed within the first 180 seconds of the holding time, and IMC growth occurred as an isothermal solidification from the Ni-saturated Sn melt. Due to the progressive densification of the IMC layer and the diffusion-controlled growth, the kinetics slowed down by approximately one order of magnitude after 180 seconds of annealing. The final stage was characterized by the formation of IMC islands ahead of the interfacial Ni3Sn4 layer. Needle-like IMC growth was effectively suppressed under combined solid-state and solid–liquid conditions. Textured Ni3Sn4 IMC formation at the Ni-Sn interface was approved with pole figure measurements. The activation energy Q for solid–liquid IMC formation was calculated as 43.3 kJ/mol, and processing maps for IMC growth and Sn consumption were derived as functions of temperature and time, respectively.

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Literature
1.
go back to reference K. Sakuma, P.S. Andry, C.K. Tsang, S.L. Wright, B. Dang, C.S. Patel, B.C. Webb, J. Maria, E.J. Sprogis, S.K. Kang, R.J. Polastre, R.R. Horton and J.U. Knickerbocker: IBM J. Res. Dev., 2008, vol. 52, pp. 611-622.CrossRef K. Sakuma, P.S. Andry, C.K. Tsang, S.L. Wright, B. Dang, C.S. Patel, B.C. Webb, J. Maria, E.J. Sprogis, S.K. Kang, R.J. Polastre, R.R. Horton and J.U. Knickerbocker: IBM J. Res. Dev., 2008, vol. 52, pp. 611-622.CrossRef
2.
go back to reference G.O. Cook III and C.D. Sorensen: J. Mater. Sci., 2011, vol. 46, pp. 5305-5323.CrossRef G.O. Cook III and C.D. Sorensen: J. Mater. Sci., 2011, vol. 46, pp. 5305-5323.CrossRef
4.
go back to reference D.Q. Yu, C.M.L. Wu, C.M.T. Law, L. Wang and J.K.L. Lai: J. Alloy. Compd., 2005, vol. 392, pp. 192-199.CrossRef D.Q. Yu, C.M.L. Wu, C.M.T. Law, L. Wang and J.K.L. Lai: J. Alloy. Compd., 2005, vol. 392, pp. 192-199.CrossRef
5.
go back to reference J. Liang, N. Dariavach, P. Callahan and D. Shangguam: Mater. Trans. JIM, 2006, vol. 47, pp. 317-325.CrossRef J. Liang, N. Dariavach, P. Callahan and D. Shangguam: Mater. Trans. JIM, 2006, vol. 47, pp. 317-325.CrossRef
6.
go back to reference J.F. Li, S.H. Mannan, M.P. Clode, D.C. Whalley and D.A. Hutt: Acta Mater., 2006, vol. 54, pp. 2907-2922.CrossRef J.F. Li, S.H. Mannan, M.P. Clode, D.C. Whalley and D.A. Hutt: Acta Mater., 2006, vol. 54, pp. 2907-2922.CrossRef
7.
go back to reference J. Shen, Y.C. Chan and S.Y. Liu: Acta Mater., 2009, vol. 57, pp. 5196-5206.CrossRef J. Shen, Y.C. Chan and S.Y. Liu: Acta Mater., 2009, vol. 57, pp. 5196-5206.CrossRef
8.
go back to reference Y. Tian, J. Chow, X. Liu, Y.P. Wu and S.K. Sitaraman: J. Electron Mater., 2013, vol. 42, pp. 230-239.CrossRef Y. Tian, J. Chow, X. Liu, Y.P. Wu and S.K. Sitaraman: J. Electron Mater., 2013, vol. 42, pp. 230-239.CrossRef
9.
go back to reference R.W. Yang, Y.W. Chang, W.C. Sung and C. Chen: Mater. Chem. Phys., 2012, vol. 134, pp. 340-344.CrossRef R.W. Yang, Y.W. Chang, W.C. Sung and C. Chen: Mater. Chem. Phys., 2012, vol. 134, pp. 340-344.CrossRef
10.
go back to reference M.N. Islam, Y.C. Chan, A. Sharif and M.O. Alam: Microelectron. Reliab., 2003, vol. 43, pp. 2031-2037.CrossRef M.N. Islam, Y.C. Chan, A. Sharif and M.O. Alam: Microelectron. Reliab., 2003, vol. 43, pp. 2031-2037.CrossRef
11.
go back to reference M. Schaefer, R. Fournelle and J. Liang: J. Electron. Mater., 1998, vol. 27, pp. 1167-1176.CrossRef M. Schaefer, R. Fournelle and J. Liang: J. Electron. Mater., 1998, vol. 27, pp. 1167-1176.CrossRef
12.
go back to reference Y.W. Lin and K.L. Lin: J. Appl. Phys., 2010, vol. 108, pp. 063536-1–063536-4. Y.W. Lin and K.L. Lin: J. Appl. Phys., 2010, vol. 108, pp. 063536-1–063536-4.
13.
14.
go back to reference R. Labie, W. Ruythooren and J. Van Humbeck: Intermetallics, 2007, vol. 15, pp. 396-403.CrossRef R. Labie, W. Ruythooren and J. Van Humbeck: Intermetallics, 2007, vol. 15, pp. 396-403.CrossRef
15.
go back to reference W. Tang, A. He, Q. Liu and D.G. Ivey: Int. J. Min: Met. Mater., 2010, vol. 17, pp. 459-463. W. Tang, A. He, Q. Liu and D.G. Ivey: Int. J. Min: Met. Mater., 2010, vol. 17, pp. 459-463.
16.
go back to reference M. Mita, M. Kajihara, N. Kurokawa and K. Sakamoto: Mater. Sci. Eng. A, 2005, vol. 403, pp. 269-275.CrossRef M. Mita, M. Kajihara, N. Kurokawa and K. Sakamoto: Mater. Sci. Eng. A, 2005, vol. 403, pp. 269-275.CrossRef
17.
go back to reference J.O. Suh, K.N. Tu, A.T. Wu and N. Tamura: J. Appl. Phys., 2011, vol. 109, pp. 123513-1–5.CrossRef J.O. Suh, K.N. Tu, A.T. Wu and N. Tamura: J. Appl. Phys., 2011, vol. 109, pp. 123513-1–5.CrossRef
19.
go back to reference D. Gur and M. Bamberger: Acta Metall. Mater., 1998, vol. 46, pp. 4917-4923.CrossRef D. Gur and M. Bamberger: Acta Metall. Mater., 1998, vol. 46, pp. 4917-4923.CrossRef
20.
go back to reference J. Görlich, D. Baither and G. Schmitz: Acta Mater., 2010, vol. 58, pp. 3187-3197.CrossRef J. Görlich, D. Baither and G. Schmitz: Acta Mater., 2010, vol. 58, pp. 3187-3197.CrossRef
21.
go back to reference S. Bader, W. Gust and H. Hieber: Acta Metall. Mater., 1995, vol. 43, pp. 329-337. S. Bader, W. Gust and H. Hieber: Acta Metall. Mater., 1995, vol. 43, pp. 329-337.
22.
go back to reference W.K. Choi, S.Y. Jang, J.H. Kim, K.W. Paik and H.M. Lee: J. Mater. Res., 2002, vol. 17, pp. 597-599.CrossRef W.K. Choi, S.Y. Jang, J.H. Kim, K.W. Paik and H.M. Lee: J. Mater. Res., 2002, vol. 17, pp. 597-599.CrossRef
23.
go back to reference J.H. Kim, S.W. Jeong and H.M. Lee: Mater. Trans. JIM, 2004, vol. 45, pp. 710-713.CrossRef J.H. Kim, S.W. Jeong and H.M. Lee: Mater. Trans. JIM, 2004, vol. 45, pp. 710-713.CrossRef
24.
go back to reference K.A. Jackson, D.R. Uhlmann and J.D. Hunt: J. Cryst. Growth, 1967, vol. 1, pp. 1-36.CrossRef K.A. Jackson, D.R. Uhlmann and J.D. Hunt: J. Cryst. Growth, 1967, vol. 1, pp. 1-36.CrossRef
25.
go back to reference A. Lis, M.S. Park, R. Arroyave and C. Leinenbach: J. Alloy. Compd., 2014, vol. 617, pp. 763-773.CrossRef A. Lis, M.S. Park, R. Arroyave and C. Leinenbach: J. Alloy. Compd., 2014, vol. 617, pp. 763-773.CrossRef
26.
go back to reference M.S. Park and R. Arroyave: J. Electron. Mater., 2009, vol. 38, pp. 2525-2533.CrossRef M.S. Park and R. Arroyave: J. Electron. Mater., 2009, vol. 38, pp. 2525-2533.CrossRef
27.
28.
go back to reference J.A. van Beek, S.S. Stolk, F.J.J. van Loo: Zeitschrift fuer Metallkunde, 1982, vol. 73, pp. 439-444. J.A. van Beek, S.S. Stolk, F.J.J. van Loo: Zeitschrift fuer Metallkunde, 1982, vol. 73, pp. 439-444.
29.
go back to reference A.M. Gusak and K.N. Tu: Phys. Rev. B, 2002, vol. 66, pp. 115403 1-14. A.M. Gusak and K.N. Tu: Phys. Rev. B, 2002, vol. 66, pp. 115403 1-14.
30.
go back to reference H. Flandorfer, U. Saeed, C. Luef, A. Sabbar and H. Ipser: Thermochim. Acta, 2007, vol. 459, pp. 34-39.CrossRef H. Flandorfer, U. Saeed, C. Luef, A. Sabbar and H. Ipser: Thermochim. Acta, 2007, vol. 459, pp. 34-39.CrossRef
31.
32.
go back to reference J.W. Chan, W.B. Hillig, G.W. Sears: Acta Metall., 1964, vol. 12, pp. 1421-1439.CrossRef J.W. Chan, W.B. Hillig, G.W. Sears: Acta Metall., 1964, vol. 12, pp. 1421-1439.CrossRef
Metadata
Title
Characteristics of Reactive Ni3Sn4 Formation and Growth in Ni-Sn Interlayer Systems
Authors
Adrian Lis
Christoph Kenel
Christian Leinenbach
Publication date
22-03-2016
Publisher
Springer US
Published in
Metallurgical and Materials Transactions A / Issue 6/2016
Print ISSN: 1073-5623
Electronic ISSN: 1543-1940
DOI
https://doi.org/10.1007/s11661-016-3444-4

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