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Journal of Materials Science: Materials in Electronics

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01-01-2024

Characterization of Sm_0.3Ce_0.2Sr_0.5MnO₃ as an electron-doped system: structural, electrical, and dielectric properties

Authors: N. Soylu Koc, M. Gökçen, A. Varilci, S. P. Altintas

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2024

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Abstract

A novel samarium-based cerium-doped ceramic manganite of Sm_0.3Ce_0.2Sr_0.5MnO₃ (SCSMO) was prepared via the high-temperature solid-state reaction method. The experimental investigation focused on exploring the crystallographic, morphological, and dielectric characteristics of the perovskite ceramic. Rietveld’s refinements of X-ray diffraction patterns confirm that a single-phase orthorhombic crystal structure with the space group of Pnma (62) without any detectable impurity phase is obtained for ceramic perovskite. Based on X-ray data, the average size of crystallites was determined to be 80.9 nm using the Williamson–Hall method. The surface morphology analysis through scanning electron microscopy (SEM) revealed distinct grains with an average size of 8.22 μm. The study utilized dielectric and impedance spectroscopy at different temperatures and frequencies to thoroughly examine the electrical parameters of SCSMO. Through this analysis, a relationship between the conduction mechanism and structural qualities was established.

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Title: Characterization of Sm0.3Ce0.2Sr0.5MnO3 as an electron-doped system: structural, electrical, and dielectric properties
Authors: N. Soylu Koc
M. Gökçen
A. Varilci
S. P. Altintas
Publication date: 01-01-2024
Publisher: Springer US
Published in: Journal of Materials Science: Materials in Electronics / Issue 1/2024
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI: https://doi.org/10.1007/s10854-023-11626-w

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