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2019 | OriginalPaper | Chapter

6. Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique

Authors : Simon Martin, Brice Gautier, Nicolas Baboux, Alexei Gruverman, Adrian Carretero-Genevrier, Martí Gich, Andres Gomez

Published in: Electrical Atomic Force Microscopy for Nanoelectronics

Publisher: Springer International Publishing

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Abstract

Atomic Force Microscopy (AFM) arises as an all-in-one characterization technique, capable of measuring several physical quantities by slight equipment’s modifications. In particular, for piezo and ferroelectricity properties, the AFM overcame the limitations of macroscopic techniques. This chapter covers all the aspects of piezo and ferroelectricity measurements performed with an AFM. The chapter is divided in three main parts, one for each available technique: Piezoresponse Force Microscopy (PFM), Nano-PUND method and Direct Piezoelectric Force Microscopy (DPFM). While PFM method is based in the converse piezoelectric effect, nanoPUND measures polarization charges and DPFM measures the direct piezoelectric effect. The working principle and characteristics for each AFM mode is fully exploited and explained from entry level to more advanced users. The chapter also focuses in useful guidelines and practical hands-on explanation for maximizing the image quality and data acquisition. Finally, a set of different application based in the use of piezo and ferroelectric materials is depicted, in which the AFM characterization took an important role as the primary characterization technique.

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Title: Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
Authors: Simon Martin
Brice Gautier
Nicolas Baboux
Alexei Gruverman
Adrian Carretero-Genevrier
Martí Gich
Andres Gomez
Publisher: Springer International Publishing
Book: Electrical Atomic Force Microscopy for Nanoelectronics
Print ISBN: 978-3-030-15611-4

Electronic ISBN: 978-3-030-15612-1

Copyright Year: 2019
DOI: https://doi.org/10.1007/978-3-030-15612-1_6