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Published in: Microsystem Technologies 9/2020

15-04-2020 | Technical Paper

DC and analog/RF performance analysis of gate extended U-shaped channel tunnel field effect transistor

Authors: Radhe Gobinda Debnath, Karabi Baruah, Srimanta Baishya

Published in: Microsystem Technologies | Issue 9/2020

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Abstract

The DC and Analog/RF performance of Gate Extended-U-shaped channel tunneling field-effect transistors (GE-UTFET) was examined in this study. The performance of the device was investigated through technology computer added design in terms of transconductance (gm), intrinsic capacitances (Cgg, Cgs, and Cgd), cut-off frequency (fT), and gain-bandwidth product (fA). Simulation results show that GE-UTFET has an improved DC characteristic than UTFET. Also, the better RF performance of GE-UTFET than UTFET makes it more suitable for high-frequency application which is attributed to the reduced miller capacitance (Cgd) and enhanced gm.

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Literature
go back to reference Bhuwalka KK, Sedlmaier S, Ludsteck AK et al (2004) Vertical tunnel field effect transistor. IEEE Trans Electron Device 51:279–282CrossRef Bhuwalka KK, Sedlmaier S, Ludsteck AK et al (2004) Vertical tunnel field effect transistor. IEEE Trans Electron Device 51:279–282CrossRef
go back to reference Choi WY, Park B, Lee JD, Liu TK (2007) Tunneling field-effect transistors (TFETs) with subthreshold swing (SS) less than 60 mV/dec. IEEE Electron Device Lett 28:743–745CrossRef Choi WY, Park B, Lee JD, Liu TK (2007) Tunneling field-effect transistors (TFETs) with subthreshold swing (SS) less than 60 mV/dec. IEEE Electron Device Lett 28:743–745CrossRef
go back to reference Kim SH, Kam H, Hu C, Liu TK (2009) Germanium-source tunnel field effect transistors with record high ION/IOFF. Symp VLSI Technol 2009:178–179 Kim SH, Kam H, Hu C, Liu TK (2009) Germanium-source tunnel field effect transistors with record high ION/IOFF. Symp VLSI Technol 2009:178–179
go back to reference Paill G, R ICUM, Poincare A, Cedex A (2004) Influence of a Tunneling gate current on the noise performance of SO1 MOSFETs. In: 2004 IEEE international SO1 conference, pp 55–57 Paill G, R ICUM, Poincare A, Cedex A (2004) Influence of a Tunneling gate current on the noise performance of SO1 MOSFETs. In: 2004 IEEE international SO1 conference, pp 55–57
go back to reference Sentaurus User's Manual (2014) Synopsys Inc., Mountain View, CA. v.2014.06 Sentaurus User's Manual (2014) Synopsys Inc., Mountain View, CA. v.2014.06
Metadata
Title
DC and analog/RF performance analysis of gate extended U-shaped channel tunnel field effect transistor
Authors
Radhe Gobinda Debnath
Karabi Baruah
Srimanta Baishya
Publication date
15-04-2020
Publisher
Springer Berlin Heidelberg
Published in
Microsystem Technologies / Issue 9/2020
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-020-04846-1

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