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Published in: Journal of Materials Science: Materials in Electronics 1/2016

11-10-2015

Defect-induced structural and ferromagnetic properties of hydrogenated Mn-doped ZnO film

Authors: Qianqian Gao, Yuqiang Dai, Qingxuan Yu, Chengbo Li, Xianchang Li, Chaojun Cui, Juan Zhang, Haibo Chen

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2016

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Abstract

The influence of hydrogenated annealing temperature on the room temperature ferromagnetism of Mn-doped ZnO films was investigated. The X-ray diffraction and X-ray photoelectron spectra reveal Mn2+ ions have been incorporated into wurtzite ZnO lattices. The saturation magnetization increases quickly with the increasing N2/H2-annealing temperature (Tan) until the temperature reaches 750 °C, and then the saturation magnetization approaches a constant value. Some foamlike materials appear in the non-continuous films when the Tan is 640 °C or above, and saturation magnetization of these films become stronger than that of the (600–630 °C) annealed films. The results of X-ray photoelectron spectra, SEM images and photoluminescence spectrum suggest that oxygen vacancy concentration of the annealed films increases with increasing Tan, which leads to the ferromagnetism of the Mn-doped ZnO film. These results demonstrate that oxygen vacancies, especially singly ionized oxygen vacancies, play a crucial role in mediating ferromagnetism of the Mn-doped ZnO film.

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Metadata
Title
Defect-induced structural and ferromagnetic properties of hydrogenated Mn-doped ZnO film
Authors
Qianqian Gao
Yuqiang Dai
Qingxuan Yu
Chengbo Li
Xianchang Li
Chaojun Cui
Juan Zhang
Haibo Chen
Publication date
11-10-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2016
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3805-6

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