Skip to main content
Top
Published in: Microsystem Technologies 9/2017

18-02-2016 | Technical Paper

Design and power analysis of 4 × 4 semiconductor ROM array with row decoder and column decoder at 32, 22 and 16 nm channel length of MOS transistor

Authors: Surajit Bari, Sonali Bhowmik, Debashis De, Angsuman Sarkar

Published in: Microsystem Technologies | Issue 9/2017

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

In this work, the design and power consumption analysis of NOR based 4 × 4 semiconductor read-only-memory (ROM) array has been presented. In this study, row decoder and column decoder has been considered in order to retrieve the data from ROM array. All the circuits are designed using nanodimensional metal oxide semiconductor (MOS) transistor. The average power consumption across the ROM array structure has been reported for the MOS transistors with channel length of 32, 22 and 16 nm. Selecting the row lines and column lines using row decoder and column decoder, data written inside the ROM array has been retrieved. In order to verify the data inside the ROM array, simulated waveforms are presented. Overall design and power consumption analysis of the ROM array in nano regime has been analyzed with the help of Tanner SPICE (T-SPICE) tools. It is seen that as power supply voltage VDD increases the average power consumption across the ROM structure also increases. This indicates that for low power design the value of VDD needs to be downscaled. Comparison of the average power consumption for MOS transistors having channel length 32, 22 and 16 nm has been reported.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Literature
go back to reference Baker J, Li RW, Boyce H (2003) CMOS circuit design, layout and simulation. P.H.I., New Delhi Baker J, Li RW, Boyce H (2003) CMOS circuit design, layout and simulation. P.H.I., New Delhi
go back to reference Bhowmik S, Bari S (2014a) Design and delay analysis of column decoder using NMOS transistor at nano level for semiconductor memory application, ICCACCS. Lecture notes in electrical engineering. Springer, Berlin. doi:10.1007/978-81-322-2274-3_42 Bhowmik S, Bari S (2014a) Design and delay analysis of column decoder using NMOS transistor at nano level for semiconductor memory application, ICCACCS. Lecture notes in electrical engineering. Springer, Berlin. doi:10.​1007/​978-81-322-2274-3_​42
go back to reference Bhowmik S, Bari S (2014b) Design of row decoder circuit for semiconductor memory at low power and small delay using MOS transistor at nano dimension channel length, ICCACCS. Lecture notes in electrical engineering. Springer, Berlin. doi:10.1007/978-81-322-2274-3_43 Bhowmik S, Bari S (2014b) Design of row decoder circuit for semiconductor memory at low power and small delay using MOS transistor at nano dimension channel length, ICCACCS. Lecture notes in electrical engineering. Springer, Berlin. doi:10.​1007/​978-81-322-2274-3_​43
go back to reference Borkute D, Patel P, Dakhole PK (2014) Power, delay and noise margin comparison of binary and quaternary SRAM. In: International Conference on Devices, Circuits and Systems, IEEE. doi:10.1109/ICDCSyst.2014.6926172 Borkute D, Patel P, Dakhole PK (2014) Power, delay and noise margin comparison of binary and quaternary SRAM. In: International Conference on Devices, Circuits and Systems, IEEE. doi:10.​1109/​ICDCSyst.​2014.​6926172
go back to reference Chang M-F (2010) A 0.29 V embedded NAND-ROM in 90 nm CMOS for ultra low voltage applications. In: IEEE International Solid-State Circuits Conference (ISSCC) Digest of Technical Papers, pp 17–19 Chang M-F (2010) A 0.29 V embedded NAND-ROM in 90 nm CMOS for ultra low voltage applications. In: IEEE International Solid-State Circuits Conference (ISSCC) Digest of Technical Papers, pp 17–19
go back to reference Chhabra A, Rawat H, Jain M, Tessier P, Pierredon D, Bergher L, Kumar P (2015) FALPEM: framework for architectural-level power estimation and optimization for large memory sub-systems. IEEE Trans Comput Aided Des Integr Circuits Syst 34:1138–1142. doi:10.1109/TCAD.2014.2387859 CrossRef Chhabra A, Rawat H, Jain M, Tessier P, Pierredon D, Bergher L, Kumar P (2015) FALPEM: framework for architectural-level power estimation and optimization for large memory sub-systems. IEEE Trans Comput Aided Des Integr Circuits Syst 34:1138–1142. doi:10.​1109/​TCAD.​2014.​2387859 CrossRef
go back to reference Kang SM, Leblebici Y (2003) CMOS digital integrated circuits analysis and design. T.M.H., New Delhi Kang SM, Leblebici Y (2003) CMOS digital integrated circuits analysis and design. T.M.H., New Delhi
go back to reference Rabaey J, Chandrakasan A, Nikolic B (2005) Digital integrated circuits a design perspective. Pearson, London Rabaey J, Chandrakasan A, Nikolic B (2005) Digital integrated circuits a design perspective. Pearson, London
go back to reference Sarkar A, De S, Sarkar CK (2011) VLSI design and EDA tools. Scitech Publications (India) Pvt Ltd, Chennai Sarkar A, De S, Sarkar CK (2011) VLSI design and EDA tools. Scitech Publications (India) Pvt Ltd, Chennai
go back to reference Shibata N, Gotoh Y (2015) High-density RAM/ROM macros using CMOS Gate-array base cells: hierarchical verification technique for reducing design cost. IEEE Trans Very Large Scale Integr VLSI Syst 23:1415–1428CrossRef Shibata N, Gotoh Y (2015) High-density RAM/ROM macros using CMOS Gate-array base cells: hierarchical verification technique for reducing design cost. IEEE Trans Very Large Scale Integr VLSI Syst 23:1415–1428CrossRef
go back to reference Umemoto Y, Nii K, Ishikawa J, Yabuuchi M, Okamoto K, Tsukamoto Y, Tanaka S, Tanaka K (2014) 28 nm 50 % Power-reducing contacted mask read only memory macro with 0.72-ns read access time using 2T pair bitcell and dynamic column source bias control technique. IEEE Trans Very Large Scale Integr VLSI Syst 22:575–584CrossRef Umemoto Y, Nii K, Ishikawa J, Yabuuchi M, Okamoto K, Tsukamoto Y, Tanaka S, Tanaka K (2014) 28 nm 50 % Power-reducing contacted mask read only memory macro with 0.72-ns read access time using 2T pair bitcell and dynamic column source bias control technique. IEEE Trans Very Large Scale Integr VLSI Syst 22:575–584CrossRef
go back to reference Uyemura J (2007) Introduction to VLSI circuits and systems. Willey, India Uyemura J (2007) Introduction to VLSI circuits and systems. Willey, India
go back to reference Wang Y, Ahn HJ, Bhattacharya U, Zhanping C, Coan T, Hamzaoglu F (2008) A 1.1 GHz 12 μA/Mb-leakage SRAM design in 65 nm ultra-low-power CMOS technology with integrated leakage reduction for mobile applications. IEEE J Solid-State Circuits 43:172–179CrossRef Wang Y, Ahn HJ, Bhattacharya U, Zhanping C, Coan T, Hamzaoglu F (2008) A 1.1 GHz 12 μA/Mb-leakage SRAM design in 65 nm ultra-low-power CMOS technology with integrated leakage reduction for mobile applications. IEEE J Solid-State Circuits 43:172–179CrossRef
go back to reference Yang B-D, Kim LS (2006) A low-power ROM using single charge—sharing capacitor and hierarchical bitline. IEEE Trans Very Large Scale Integr VLSI Syst 14:313–322CrossRef Yang B-D, Kim LS (2006) A low-power ROM using single charge—sharing capacitor and hierarchical bitline. IEEE Trans Very Large Scale Integr VLSI Syst 14:313–322CrossRef
Metadata
Title
Design and power analysis of 4 × 4 semiconductor ROM array with row decoder and column decoder at 32, 22 and 16 nm channel length of MOS transistor
Authors
Surajit Bari
Sonali Bhowmik
Debashis De
Angsuman Sarkar
Publication date
18-02-2016
Publisher
Springer Berlin Heidelberg
Published in
Microsystem Technologies / Issue 9/2017
Print ISSN: 0946-7076
Electronic ISSN: 1432-1858
DOI
https://doi.org/10.1007/s00542-016-2875-6

Other articles of this Issue 9/2017

Microsystem Technologies 9/2017 Go to the issue