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2016 | OriginalPaper | Chapter

Design of an Analog Fault Model for CMOS Switched Capacitor Low Pass Filter

Authors : K. Babulu, R. Gurunadha, M. Saikumar

Published in: Microelectronics, Electromagnetics and Telecommunications

Publisher: Springer India

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Abstract

In this paper an analog fault model for a CMOS switched capacitor low pass filter is tested. The switched capacitor (SC) low pass filter circuit is modularized into functional macros. These functional macros include OPAMP, switches and capacitors. The circuit is identified as faulty if the frequency response of the transfer function does not meet the design specification. The signal flow graph (SFG) models of all the macros are analyzed to get the faulty transfer function of the circuit under test (CUT). A CMOS switched capacitor low pass filter for signal receiver applications is chosen as an example to demonstrate the testing of the analog fault model. The responses of the CUT are simulated using MENTOR GRAPHICS tool with 0.13 μm technology.

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Literature
1.
go back to reference L.-T. Wang, C.-W. Wu, X.-G. Wen, VLSI test Principles and Architectures. 500 Sansome St., Suite 400, San Francisco, CA 94111: Morgan Kaufmann Publishers (2006) L.-T. Wang, C.-W. Wu, X.-G. Wen, VLSI test Principles and Architectures. 500 Sansome St., Suite 400, San Francisco, CA 94111: Morgan Kaufmann Publishers (2006)
2.
go back to reference M. Soma, V. Kolarik, A design-for-test technique for switched capacitor filters. in Proceedings of IEEE VLSI Test Symposium (1994), pp. 42–47 M. Soma, V. Kolarik, A design-for-test technique for switched capacitor filters. in Proceedings of IEEE VLSI Test Symposium (1994), pp. 42–47
3.
go back to reference H.C. Hong, A static linear behavior analog fault model for switched capacitor circuits. IEEE Trans. Comput. Aided Des. Integr. Circ. Syst. 31(4), 597–609 (2012)CrossRef H.C. Hong, A static linear behavior analog fault model for switched capacitor circuits. IEEE Trans. Comput. Aided Des. Integr. Circ. Syst. 31(4), 597–609 (2012)CrossRef
4.
go back to reference N. Nagi, A. Chatterjee, A. Balivada, J.A. Abraham, Fault-based automatic test generator for linear analog circuits. in Proceedings of IEEE/ACM International Conference Computer-Aided Design (ICCAD) (1993), pp. 88–91 N. Nagi, A. Chatterjee, A. Balivada, J.A. Abraham, Fault-based automatic test generator for linear analog circuits. in Proceedings of IEEE/ACM International Conference Computer-Aided Design (ICCAD) (1993), pp. 88–91
5.
go back to reference U.-K. Moon, CMOS high-frequency switched-capacitor filters for telecommunication applications, IEEE J. Solid-State Circuits 35(2), 212–220 (2000) U.-K. Moon, CMOS high-frequency switched-capacitor filters for telecommunication applications, IEEE J. Solid-State Circuits 35(2), 212–220 (2000)
6.
go back to reference A. Petraglia, J. Canive, M. Petraglia, Efficient parametric fault detection in switched-capacitor filters. IEEE Des. Test Comput. 23(1), 58–66 (2006)CrossRef A. Petraglia, J. Canive, M. Petraglia, Efficient parametric fault detection in switched-capacitor filters. IEEE Des. Test Comput. 23(1), 58–66 (2006)CrossRef
7.
go back to reference L.-Y. Lin, H.-C. Hong, Design of a fault-injectable fleischer-laker switched capacitor biquad for verifying the static linear behavior fault model. in 22nd Asian Test Symposium (2013) L.-Y. Lin, H.-C. Hong, Design of a fault-injectable fleischer-laker switched capacitor biquad for verifying the static linear behavior fault model. in 22nd Asian Test Symposium (2013)
8.
go back to reference M. Fino, J. Franca, A. Steiger-Garcao, Automatic symbolic analysis of switched-capacitor filtering networks using signal flow graphs. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 14(7), 858–867 (1995) M. Fino, J. Franca, A. Steiger-Garcao, Automatic symbolic analysis of switched-capacitor filtering networks using signal flow graphs. IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. 14(7), 858–867 (1995)
9.
go back to reference S.F. Hung, L.Y. Lin, H.-C. Hong, A study on the design of a testable fleisher-laker switched-capacitor biquad. in Proceedings of International Mixed-Signals, Sensors, and System Testing Workshop (IMS3TW) (2012), pp. 119–122 S.F. Hung, L.Y. Lin, H.-C. Hong, A study on the design of a testable fleisher-laker switched-capacitor biquad. in Proceedings of International Mixed-Signals, Sensors, and System Testing Workshop (IMS3TW) (2012), pp. 119–122
Metadata
Title
Design of an Analog Fault Model for CMOS Switched Capacitor Low Pass Filter
Authors
K. Babulu
R. Gurunadha
M. Saikumar
Copyright Year
2016
Publisher
Springer India
DOI
https://doi.org/10.1007/978-81-322-2728-1_48