Skip to main content
Top
Published in: Metallurgical and Materials Transactions A 4/2013

01-04-2013

Directional Solidification and Liquidus Projection of the Sn-Co-Cu System

Authors: Sinn-Wen Chen, Jui-Shen Chang, Kevin Pan, Chia-Ming Hsu, Che-Wei Hsu

Published in: Metallurgical and Materials Transactions A | Issue 4/2013

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This study investigates the Sn-Co-Cu ternary system, which is of interest to the electronics industry. Ternary Sn-Co-Cu alloys were prepared, their as-solidified microstructures were examined, and their primary solidification phases were determined. The primary solidification phases observed were Cu, Co, Co3Sn2, CoSn, CoSn2, Cu6Sn5, Co3Sn2, γ, and β phases. Although there are ternary compounds reported in this ternary system, no ternary compound was found as the primary solidification phase. The directional solidification technique was applied when difficulties were encountered using the conventional quenching method to distinguish the primary solidification phases, such as Cu6Sn5, Cu3Sn, and γ phases. Of all the primary solidification phases, the Co3Sn2 and Co phases have the largest compositional regimes in which alloys display them as the primary solidification phases. There are four class II reactions and four class III reactions. The reactions with the highest and lowest reaction temperatures are both class III reactions, and are L + CoSn2 + Cu6Sn5  =  CoSn3 at 621.5 K (348.3 °C) and L + Co3Sn2 + CoSn = Cu6Sn5 at 1157.8 K (884.6 °C), respectively.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Footnotes
1
JEOL is a trademark of Japan Electron Optics Ltd., Tokyo.
 
Literature
1.
go back to reference “Directive 2002/95/EC of the European Parliament and of the Council: On the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment,” Official J. Europ. Union, 2003, pp. L37/19–L37/23. “Directive 2002/95/EC of the European Parliament and of the Council: On the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment,” Official J. Europ. Union, 2003, pp. L37/19–L37/23.
2.
go back to reference S.-W. Chen, C.-H. Wang, S.-K. Lin, and C.-N. Chiu: J. Mater. Sci.: Mater. Electron., 2007, vol. 18, pp. 19–37.CrossRef S.-W. Chen, C.-H. Wang, S.-K. Lin, and C.-N. Chiu: J. Mater. Sci.: Mater. Electron., 2007, vol. 18, pp. 19–37.CrossRef
3.
go back to reference S.K. Kang, P. Gruber, and D.-Y. Shih: JOM, 2008, vol. 6, pp. 66–70. S.K. Kang, P. Gruber, and D.-Y. Shih: JOM, 2008, vol. 6, pp. 66–70.
4.
go back to reference Y.K. Jee, J. Yu, K.W. Park, and T.S. Oh: J. Electron. Mater., 2009, vol. 38 (5), pp. 685–90.CrossRef Y.K. Jee, J. Yu, K.W. Park, and T.S. Oh: J. Electron. Mater., 2009, vol. 38 (5), pp. 685–90.CrossRef
5.
go back to reference D.H. Kim, M.G. Cho, S.-K. Seo, and H.M. Lee: J. Electron. Mater., 2009, vol. 38 (1), pp. 39–45. D.H. Kim, M.G. Cho, S.-K. Seo, and H.M. Lee: J. Electron. Mater., 2009, vol. 38 (1), pp. 39–45.
6.
go back to reference Y.-C. Huang and S.-W. Chen: J. Mater. Res., 2010, vol. 25 (12), pp. 2430–38.CrossRef Y.-C. Huang and S.-W. Chen: J. Mater. Res., 2010, vol. 25 (12), pp. 2430–38.CrossRef
7.
go back to reference Y.-C. Huang and S.-W. Chen: J. Electron. Mater., 2011, vol. 40 (1), pp. 62–70.CrossRef Y.-C. Huang and S.-W. Chen: J. Electron. Mater., 2011, vol. 40 (1), pp. 62–70.CrossRef
8.
go back to reference L. Liu, C. Andersson, J. Liu, and Y.C. Chan: Adv. Electron. Packag., 2003, vol. 1, pp. 141–45. L. Liu, C. Andersson, J. Liu, and Y.C. Chan: Adv. Electron. Packag., 2003, vol. 1, pp. 141–45.
9.
go back to reference L. Liu, C. Andersson, and J. Liu: J. Electron. Mater., 2004, vol. 33 (9), pp. 935–39.CrossRef L. Liu, C. Andersson, and J. Liu: J. Electron. Mater., 2004, vol. 33 (9), pp. 935–39.CrossRef
10.
go back to reference C. Andersson, L. Liu, and J. Liu: 2006 Electronic System Integration Technol. Conf. Proc., IEEE, Piscataway, NJ, 2006, pp. 152–60. C. Andersson, L. Liu, and J. Liu: 2006 Electronic System Integration Technol. Conf. Proc., IEEE, Piscataway, NJ, 2006, pp. 152–60.
11.
go back to reference P. Sun, C. Andersson, X. Wei, Z. Cheng, D. Shangguan, and J. Liu: Mater. Sci. Eng. B, 2006, vol. 135, pp. 134–40.CrossRef P. Sun, C. Andersson, X. Wei, Z. Cheng, D. Shangguan, and J. Liu: Mater. Sci. Eng. B, 2006, vol. 135, pp. 134–40.CrossRef
12.
go back to reference C. Andersson, P. Sun, and J. Liu: J. Alloy. Compd., 2008, vol. 457, pp. 97–105.CrossRef C. Andersson, P. Sun, and J. Liu: J. Alloy. Compd., 2008, vol. 457, pp. 97–105.CrossRef
13.
go back to reference F. Gao, F. Cheng, H. Nishikawa, and T. Takemoto: Mater. Lett., 2008, vol. 62, pp. 2257–59.CrossRef F. Gao, F. Cheng, H. Nishikawa, and T. Takemoto: Mater. Lett., 2008, vol. 62, pp. 2257–59.CrossRef
14.
go back to reference S.-W. Chen, Y.-K. Chen, H.-J. Wu, Y.-C. Huang, and C.-M. Chen: J. Electron. Mater., 2010, vol. 39 (11) pp. 2418–28.CrossRef S.-W. Chen, Y.-K. Chen, H.-J. Wu, Y.-C. Huang, and C.-M. Chen: J. Electron. Mater., 2010, vol. 39 (11) pp. 2418–28.CrossRef
15.
go back to reference W. Zhu, H. Liu, J. Wang, H. Dong, and Z. Jin: J. Alloy. Compd., 2009, vol. 481, pp. 503–08.CrossRef W. Zhu, H. Liu, J. Wang, H. Dong, and Z. Jin: J. Alloy. Compd., 2009, vol. 481, pp. 503–08.CrossRef
16.
go back to reference S.K. Lin, C.-F. Yang, S.-H. Wu, and S.-W. Chen: J. Electron. Mater., 2008, vol. 37 (4), pp. 498–506. S.K. Lin, C.-F. Yang, S.-H. Wu, and S.-W. Chen: J. Electron. Mater., 2008, vol. 37 (4), pp. 498–506.
17.
go back to reference Y.-C. Huang, S.-W. Chen, C.-Y. Chou, and W. Gierlotka: J. Alloys Compd., 2009, vol. 477 (1–2), pp. 283–90.CrossRef Y.-C. Huang, S.-W. Chen, C.-Y. Chou, and W. Gierlotka: J. Alloys Compd., 2009, vol. 477 (1–2), pp. 283–90.CrossRef
18.
go back to reference S.-W. Chen, H.-J. Wu, Y.-C. Huang, and W. Gierlotka: J. Alloy. Compd., 2010, vol. 497 (1–2), pp. 110–17.CrossRef S.-W. Chen, H.-J. Wu, Y.-C. Huang, and W. Gierlotka: J. Alloy. Compd., 2010, vol. 497 (1–2), pp. 110–17.CrossRef
19.
go back to reference M. Jiang, J. Sata, I. Ohnuma, R. Kainuma, and K. Ishida: Comput. Coupling Phase Diag. Thermochem., 2004, vol. 28, pp. 213–20.CrossRef M. Jiang, J. Sata, I. Ohnuma, R. Kainuma, and K. Ishida: Comput. Coupling Phase Diag. Thermochem., 2004, vol. 28, pp. 213–20.CrossRef
20.
go back to reference W. Gierlotka, S.-W. Chen, and S.-K. Lin: J. Mater. Res., 2007, vol. 22 (11), pp. 3158–65.CrossRef W. Gierlotka, S.-W. Chen, and S.-K. Lin: J. Mater. Res., 2007, vol. 22 (11), pp. 3158–65.CrossRef
21.
go back to reference T. Nishizawa and K. Ishida: J. Phase Equilibria, 1984, vol. 5 (2), pp. 161–65. T. Nishizawa and K. Ishida: J. Phase Equilibria, 1984, vol. 5 (2), pp. 161–65.
22.
go back to reference R.J. Schaffer and D.J. Lewis: Metall. Mater. Trans. A, 2005, vol. 36A, pp. 2775–83.CrossRef R.J. Schaffer and D.J. Lewis: Metall. Mater. Trans. A, 2005, vol. 36A, pp. 2775–83.CrossRef
23.
go back to reference C. Zhang, D. Ma, K.-S. Wu, H.-B. Cao, G.-P. Cao, S. Kou, Y.A. Chang, and X.-Y. Yan: Intermetallics, 2007, vol. 15, pp. 1395–1400.CrossRef C. Zhang, D. Ma, K.-S. Wu, H.-B. Cao, G.-P. Cao, S. Kou, Y.A. Chang, and X.-Y. Yan: Intermetallics, 2007, vol. 15, pp. 1395–1400.CrossRef
24.
go back to reference Y.-K. Chen: Master’s Thesis, National Tsing Hua University, Hsin-chu, Taiwan, 2009. Y.-K. Chen: Master’s Thesis, National Tsing Hua University, Hsin-chu, Taiwan, 2009.
25.
go back to reference S.-W. Chen, C.-C. Huang, and J.-C. Lin: Chem. Eng. Sci., 1995, vol. 50 (3), pp. 417–31.CrossRef S.-W. Chen, C.-C. Huang, and J.-C. Lin: Chem. Eng. Sci., 1995, vol. 50 (3), pp. 417–31.CrossRef
26.
27.
go back to reference W.J. Boettinger, U.R. Kattner, K.-W. Moon, and J. Perepezko: “DTA and Heat-Flux DSC Measurements of Alloy Melting and Freezing,” National Institute of Standards and Technology, Washington, DC, 2006. W.J. Boettinger, U.R. Kattner, K.-W. Moon, and J. Perepezko: “DTA and Heat-Flux DSC Measurements of Alloy Melting and Freezing,” National Institute of Standards and Technology, Washington, DC, 2006.
Metadata
Title
Directional Solidification and Liquidus Projection of the Sn-Co-Cu System
Authors
Sinn-Wen Chen
Jui-Shen Chang
Kevin Pan
Chia-Ming Hsu
Che-Wei Hsu
Publication date
01-04-2013
Publisher
Springer US
Published in
Metallurgical and Materials Transactions A / Issue 4/2013
Print ISSN: 1073-5623
Electronic ISSN: 1543-1940
DOI
https://doi.org/10.1007/s11661-012-1545-2

Other articles of this Issue 4/2013

Metallurgical and Materials Transactions A 4/2013 Go to the issue

Premium Partners