Skip to main content
Disciplines
Automotive Business IT + Informatics Construction + Real Estate Electrical Engineering + Electronics Energy + Sustainability Insurance + Risk Finance + Banking Management + Leadership Marketing + Sales Mechanical Engineering + Materials
Events
DE
EN
Books
Journals
Topic Page
Marketing
Start single access now
Access for companies
EXTENDED SEARCH
Log in
Top
Journal of Electronic Materials
Published in: Journal of Electronic Materials 8/2011

01-08-2011

Dislocation Analysis in (112)B HgCdTe/CdTe/Si

Authors: J. D. Benson, S. Farrell, G. Brill, Y. Chen, P. S. Wijewarnasuriya, L. O. Bubulac, P. J. Smith, R. N. Jacobs, J. K. Markunas, M. Jaime-Vasquez, L. A. Almeida, A. Stoltz, U. Lee, M. F. Vilela, J. Peterson, S. M. Johnson, D. D. Lofgreen, D. Rhiger, E. A. Patten, P. M. Goetz

Published in: Journal of Electronic Materials | Issue 8/2011

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …
previous article HgCdTe Photon Trapping Structure for Broadband Mid-Wavelength Infrared Absorption
next article CdZnTe Radiation Detectors with HgTe/HgCdTe Superlattice Contacts for Leakage Current Reduction

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

inform now

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

inform now
Metadata
Title
Dislocation Analysis in (112)B HgCdTe/CdTe/Si
Authors
J. D. Benson
S. Farrell
G. Brill
Y. Chen
P. S. Wijewarnasuriya
L. O. Bubulac
P. J. Smith
R. N. Jacobs
J. K. Markunas
M. Jaime-Vasquez
L. A. Almeida
A. Stoltz
U. Lee
M. F. Vilela
J. Peterson
S. M. Johnson
D. D. Lofgreen
D. Rhiger
E. A. Patten
P. M. Goetz
Publication date
01-08-2011
Publisher
Springer US
Published in
Journal of Electronic Materials / Issue 8/2011
Print ISSN: 0361-5235
Electronic ISSN: 1543-186X
DOI
https://doi.org/10.1007/s11664-011-1670-5

Other articles of this Issue 8/2011

Journal of Electronic Materials 8/2011 Go to the issue

News

Foreword

OriginalPaper

Status of p-on-n Arsenic-Implanted HgCdTe Technologies

OriginalPaper

Internal Electric Field Behavior of Cadmium Zinc Telluride Radiation Detectors Under High Carrier Injection

OriginalPaper

Three-State Quantum Dot Gate FETs Using ZnS-ZnMgS Lattice-Matched Gate Insulator on Silicon

OriginalPaper

Molecular Beam Epitaxy Growth of HgCdTe on Large-Area Si and CdZnTe Substrates

OriginalPaper

Nonvolatile Memory Effect in Indium Gallium Arsenide-Based Metal–Oxide–Semiconductor Devices Using II–VI Tunnel Insulators