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Published in:
2004 | OriginalPaper | Chapter
Dynamic Force Microscopy
Authors : André Schirmeisen, Boris Anczykowski, Harald Fuchs
Published in: Applied Scanning Probe Methods
Publisher: Springer Berlin Heidelberg
Included in: Professional Book Archive
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This chapter is an introduction to the concept of the dynamic mode of the atomic force microscope (AFM). While the first part is dedicated towards a systematic discussion of the different operational modes in dynamic AFM, some practical issues for the experimentalist are pointed out. Special care is taken to explain the quantitative relation of the experimental parameters with the physical magnitudes, like force and dissipation.