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Journal of Electronic Testing
Published in: Journal of Electronic Testing 3/2017

06-05-2017

Editorial

Author: Vishwani D. Agrawal

Published in: Journal of Electronic Testing | Issue 3/2017

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Excerpt

August 2016 was a special issue on mixed-signal test. Repeating that theme in less than a year emphasizes its significance and growing interest. Considering the expanding applications internet-of-things (IoT) is no longer a buzzword. It is clear that electronics has outgrown its optional roles and is becoming an essential part of our existence. As a result, we will be giving greater attention to the reliability and security aspects of analog and radio frequency (RF) devices. …
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Metadata
Title
Editorial
Author
Vishwani D. Agrawal
Publication date
06-05-2017
Publisher
Springer US
Published in
Journal of Electronic Testing / Issue 3/2017
Print ISSN: 0923-8174
Electronic ISSN: 1573-0727
DOI
https://doi.org/10.1007/s10836-017-5664-y

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A Passive Authentication System Based on Optical Variable Nano/Micro-Structures

EditorialNotes

Guest Editorial: Analog, Mixed-Signal and RF Testing

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New Calibration Technique of Contact-less Resonant Biosensor