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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 11/2024

01-04-2024

Effect of limited current on ultrarapid densification and giant dielectric properties of flash sintering (La, Ta) co-doped TiO2 ceramics

Authors: Zaizhi Yang, Xi Wang, Liang Zhang, Hailing Li, Hui Zhang, Dong Xu

Published in: Journal of Materials Science: Materials in Electronics | Issue 11/2024

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Abstract

Flash sintering is considered a promising energy-saving and efficient technology for preparing high-temperature ceramics. The effects of limited current on flash sintering parameters, microstructure, and electrical properties of (La1/2, Ta1/2)0.02Ti0.98O2 ceramic were investigated by the XRD, SEM, XPS, and precision impedance analyzer. With limiting current increase, the grain size of flash sintering sample increases gradually, and the relative density increases first and then decreases. The average grain size is about 1 μm, and the highest relative density is 96.9%. Joule heating runaway and oxygen vacancy defect lead to rapid densification of flash sintering La and Ta co-doped TiO2 ceramics. According to the EPDD model, doped La3+ and Ta5+ ions increase the concentration of oxygen vacancies and free electrons, lead to local polarization of carriers, and obtain a giant dielectric constant of ε’ = 7.6 × 104 and low dielectric loss of tanδ = 0.11. At high temperature, electrons break free from the constraints of defect clusters and accumulate at the interface, leading to interface polarization due to the IBLC model. The giant dielectric properties originate from the combined effect of EPDD and IBLC model.
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Metadata
Title
Effect of limited current on ultrarapid densification and giant dielectric properties of flash sintering (La, Ta) co-doped TiO2 ceramics
Authors
Zaizhi Yang
Xi Wang
Liang Zhang
Hailing Li
Hui Zhang
Dong Xu
Publication date
01-04-2024
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 11/2024
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-024-12518-3

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