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Published in: Journal of Materials Science: Materials in Electronics 7/2020

21-02-2020

Effect of Ni content on the creep properties of Cu/Sn–0.3Ag–0.7Cu/Cu solder micro-joints

Authors: Zongxiang Yao, Diying Ling, Limeng Yin, Gang Wang, Hehe Zhang, Shan Jiang

Published in: Journal of Materials Science: Materials in Electronics | Issue 7/2020

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Abstract

The tensile creep properties of line-type Cu/Sn–0.3Ag–0.7Cu(SAC0307)–xNi (x = 0, 0.02, 0.05 and 0.10 wt%)/Cu solder micro-joints were comparatively investigated via dynamic mechanical analysis. The effect of Ni content on the creep behaviour of the solder micro-joints was analysed and discussed. The creep behaviour of the joints at various temperatures and applied stresses was described by a power law. The results showed that the creep lifetime, creep activation energy and creep stress exponent of the Ni-containing solder micro-joints were greater than those of the Ni-free joint. Hence, adding Ni to the SAC0307 solder can enhance the creep resistance of the solder joints. The creep activation energy and the creep stress exponent of the solder micro-joints at 353–398 K and under a tensile stress of 8–15 MPa were 82.44–93.36 kJ/mol and 4.35–4.75, respectively. As the Ni content increased, the creep activation energy and the creep stress exponent first increased and then decreased. The Cu/SAC0307–0.05Ni/Cu solder micro-joint exhibited the strongest creep resistance among the tested joints. The creep deformation mechanisms of all solder micro-joints were mainly controlled by dislocation climbing, and the main creep failure mode was mixed brittle/ductile fracture.

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Literature
1.
go back to reference Y. Zhu, F.L. Sun, Geometric size effect on IMC growth and elements diffusion of Cu/Sn/Cu solder joints. Solder. Surf. Mount Technol. 29(2), 85–91 (2017)CrossRef Y. Zhu, F.L. Sun, Geometric size effect on IMC growth and elements diffusion of Cu/Sn/Cu solder joints. Solder. Surf. Mount Technol. 29(2), 85–91 (2017)CrossRef
2.
go back to reference L. Zhang, Z.Q. Liu, Inhibition of intermetallic compounds growth at Sn-58Bi/Cu interface bearing CuZnAl memory particles (2–6 μm). J. Mater. Sci. 31, 2466–2480 (2020) L. Zhang, Z.Q. Liu, Inhibition of intermetallic compounds growth at Sn-58Bi/Cu interface bearing CuZnAl memory particles (2–6 μm). J. Mater. Sci. 31, 2466–2480 (2020)
3.
go back to reference L.M. Yin, S. Wei, Z. Xu et al., The effect of joint size on the creep properties of microscale lead-free solder joints at elevated temperatures. J. Mater. Sci. 24(4), 1369–1374 (2013) L.M. Yin, S. Wei, Z. Xu et al., The effect of joint size on the creep properties of microscale lead-free solder joints at elevated temperatures. J. Mater. Sci. 24(4), 1369–1374 (2013)
4.
go back to reference K. Lee, J.W. Morris, F. Hua, Mechanisms of creep deformation in pure Sn solder joints. J. Electron. Mater. 42(3), 516–526 (2013)CrossRef K. Lee, J.W. Morris, F. Hua, Mechanisms of creep deformation in pure Sn solder joints. J. Electron. Mater. 42(3), 516–526 (2013)CrossRef
5.
go back to reference L.M. Yin, M. Pecht, S. Wei, Y.F. Geng, Z.X. Yao, Effect of joint height on the mechanical behaviors of micro-scale solder joints. Trans. China Weld. Inst. 34(8), 27–30 (2013) L.M. Yin, M. Pecht, S. Wei, Y.F. Geng, Z.X. Yao, Effect of joint height on the mechanical behaviors of micro-scale solder joints. Trans. China Weld. Inst. 34(8), 27–30 (2013)
6.
go back to reference X.X. Kong, F.L. Sun, M.S. Yang, Y. Liu, Effect of Bi and Ni concentration on the creep behavior of the bulks of Cu/SAC/Cu micro solder joints. J. Mech. Eng. 53(2), 53–60 (2017)CrossRef X.X. Kong, F.L. Sun, M.S. Yang, Y. Liu, Effect of Bi and Ni concentration on the creep behavior of the bulks of Cu/SAC/Cu micro solder joints. J. Mech. Eng. 53(2), 53–60 (2017)CrossRef
7.
go back to reference X. Li, F.L. Sun, Y. Liu, Y. Liu, Thermal shock and thermal aging performance of SAC-Bi-Ni solder joint. Chin. J. Stereol. Image Analy. 10(4), 37–43 (2012) X. Li, F.L. Sun, Y. Liu, Y. Liu, Thermal shock and thermal aging performance of SAC-Bi-Ni solder joint. Chin. J. Stereol. Image Analy. 10(4), 37–43 (2012)
8.
go back to reference F.L. Sun, W.G. Hu, L.F. Wang, X. Ma, Influence of Bi on the melting point and wettability of Sn-0.3Ag-0.7Cu lead-free solder. Trans. China Weld. Inst. 29(10), 5–8 (2008) F.L. Sun, W.G. Hu, L.F. Wang, X. Ma, Influence of Bi on the melting point and wettability of Sn-0.3Ag-0.7Cu lead-free solder. Trans. China Weld. Inst. 29(10), 5–8 (2008)
9.
go back to reference Y. Liu, F.L. Sun, Y. Liu, X.M. Li, Effect of Ni, Bi concentration on the microstructure and shear behavior of low-Ag SAC-Bi-Ni/Cu solder joints. J. Mater. Sci. 25(6), 2627–2633 (2014) Y. Liu, F.L. Sun, Y. Liu, X.M. Li, Effect of Ni, Bi concentration on the microstructure and shear behavior of low-Ag SAC-Bi-Ni/Cu solder joints. J. Mater. Sci. 25(6), 2627–2633 (2014)
10.
go back to reference Y. Liu, F.L. Sun, Effect of Ni and Bi addition on growth rate of intermetallic compound of SnAgCu soldering. Chin. J. Nonferrous Metals 22(2), 460–464 (2012) Y. Liu, F.L. Sun, Effect of Ni and Bi addition on growth rate of intermetallic compound of SnAgCu soldering. Chin. J. Nonferrous Metals 22(2), 460–464 (2012)
11.
go back to reference M.S. Yang, F.L. Sun, P.F. Zou, Plasticity and creep performance of low-Ag SnAgCuBi-xNi/Cu solder joint. Trans. China Weld. Inst. 35(3), 31–34 (2014) M.S. Yang, F.L. Sun, P.F. Zou, Plasticity and creep performance of low-Ag SnAgCuBi-xNi/Cu solder joint. Trans. China Weld. Inst. 35(3), 31–34 (2014)
12.
go back to reference C.K. Lin, D.Y. Chu, Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders. J. Mater. Sci. 16(6), 355–365 (2005) C.K. Lin, D.Y. Chu, Creep rupture of lead-free Sn-3.5Ag and Sn-3.5Ag-0.5Cu solders. J. Mater. Sci. 16(6), 355–365 (2005)
13.
go back to reference H. Mavoori, J. Chin, S. Vaynman et al., Creep, stress relaxation, and plastic deformation in Sn-Ag and Sn-Zn eutectic solders. J. Electron. Mater. 26(7), 783–790 (1997)CrossRef H. Mavoori, J. Chin, S. Vaynman et al., Creep, stress relaxation, and plastic deformation in Sn-Ag and Sn-Zn eutectic solders. J. Electron. Mater. 26(7), 783–790 (1997)CrossRef
14.
go back to reference J. Weertman, in Proceedings of the 2nd international conference on creep and fracture in engineering materials and structures, ed. by B. Wilshire, D.R.J. Owen (Pineridge Press, Swansea, 1984), p. 1 J. Weertman, in Proceedings of the 2nd international conference on creep and fracture in engineering materials and structures, ed. by B. Wilshire, D.R.J. Owen (Pineridge Press, Swansea, 1984), p. 1
15.
go back to reference Y. Kanda, Y. Kariya, Evaluation of creep properties for Sn-Ag-Cu micro solder joint by multi-temperature stress relaxation test. Microelectron. Reliab. 52(7), 1435–1440 (2012)CrossRef Y. Kanda, Y. Kariya, Evaluation of creep properties for Sn-Ag-Cu micro solder joint by multi-temperature stress relaxation test. Microelectron. Reliab. 52(7), 1435–1440 (2012)CrossRef
16.
go back to reference L. Qiao, Y. Zuo, L. Ma, Y. Shu, Failure behaviors of Sn-0.3Ag-0.7Cu solder joint under creep and current stressing. In: 2014 15th International Conference on Electronic Packaging Technology (ICEPT), pp. 902–906 (2014) L. Qiao, Y. Zuo, L. Ma, Y. Shu, Failure behaviors of Sn-0.3Ag-0.7Cu solder joint under creep and current stressing. In: 2014 15th International Conference on Electronic Packaging Technology (ICEPT), pp. 902–906 (2014)
17.
go back to reference M.Y. Xiong, L. Zhang, Interface reaction and intermetallic compound growth behavior of Sn-Ag-Cu lead-free solder joints on different substrates in electronic packaging. J. Mater. Sci. 54(2), 1741–1768 (2019)CrossRef M.Y. Xiong, L. Zhang, Interface reaction and intermetallic compound growth behavior of Sn-Ag-Cu lead-free solder joints on different substrates in electronic packaging. J. Mater. Sci. 54(2), 1741–1768 (2019)CrossRef
18.
go back to reference X.P. Zhang, C.B. Yu, Y.P. Zhang, M. Zhu, Creep-resistant performance of two lead-free solders and comparison with Sn60Pb40 solder. Trans. China Weld. Inst. 28(2), 1–4 (2007) X.P. Zhang, C.B. Yu, Y.P. Zhang, M. Zhu, Creep-resistant performance of two lead-free solders and comparison with Sn60Pb40 solder. Trans. China Weld. Inst. 28(2), 1–4 (2007)
Metadata
Title
Effect of Ni content on the creep properties of Cu/Sn–0.3Ag–0.7Cu/Cu solder micro-joints
Authors
Zongxiang Yao
Diying Ling
Limeng Yin
Gang Wang
Hehe Zhang
Shan Jiang
Publication date
21-02-2020
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 7/2020
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-020-03109-z

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