Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 15/2019

08-07-2019

Electrical properties of perovskite YFeO3 based ceramics modified by Cu/Nb ions as negative temperature coefficient thermistors

Authors: Yuan Zeng, Zhicheng Li, Junming Shao, Xianchi Wang, Wenbin Hao, Hong Zhang

Published in: Journal of Materials Science: Materials in Electronics | Issue 15/2019

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

Cu/Nb doped YFeO3 ceramics were synthesized through wet chemical method followed by traditional ceramic sintering technology. The phase component and electrical properties of the ceramics were investigated. The XRD pattern shows that all the prepared ceramics have the orthorhombic perovskite structure with space group of Pnma. The XPS analysis demonstrates the existence of Fe2+ and Fe3+ in the ceramics. The temperature dependence of resistivity indicates that YFeO3-based materials have a characteristics of negative temperature coefficient (NTC) of resistivity. The room temperature resistivities (306–1.52 × 105 Ω cm) and temperature sensitivity B values (2693–5395 K) can be effectively adjusted by changing the contents of Cu- and Nb- ions. According to the analysis of complex impedance spectra at various temperatures, the NTC characteristic could be attributed to grain effect and grain boundary effect. The possible conduction mechanisms are propose to hopping conduction and band conduction in grain, and thermal activation transport of charge carries in grain boundary.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference Z. Pan, D. Hu, Y. Zhang, J. Liu, B. Shen, J. Zhai, J. Mater. Chem. C 7, 4072–4078 (2019)CrossRef Z. Pan, D. Hu, Y. Zhang, J. Liu, B. Shen, J. Zhai, J. Mater. Chem. C 7, 4072–4078 (2019)CrossRef
3.
go back to reference B. Dhanalakshmi, P. Kollu, B.P. Rao, P.S.V. Subba Rao. Ceram. Int., 42, 2186-2197 (2016) B. Dhanalakshmi, P. Kollu, B.P. Rao, P.S.V. Subba Rao. Ceram. Int., 42, 2186-2197 (2016)
4.
5.
7.
go back to reference Y. Liu, H. Zhang, W. Fu, Z. Yang, Z. Li, J. Mater. Sci.: Mater. Electron. 29, 18797–18806 (2018) Y. Liu, H. Zhang, W. Fu, Z. Yang, Z. Li, J. Mater. Sci.: Mater. Electron. 29, 18797–18806 (2018)
8.
go back to reference W. Fu, Z. Li, P. Li, Y. Zeng, H. Zhang, J. Mater. Sci.: Mater. Electron. 29, 11637–11645 (2018) W. Fu, Z. Li, P. Li, Y. Zeng, H. Zhang, J. Mater. Sci.: Mater. Electron. 29, 11637–11645 (2018)
9.
go back to reference Y. Liu, S. Leng, S. Li, W. Fu, Z. Li, H. Zhang, Mater. Res. Express 5, 036307–036316 (2018)CrossRef Y. Liu, S. Leng, S. Li, W. Fu, Z. Li, H. Zhang, Mater. Res. Express 5, 036307–036316 (2018)CrossRef
10.
go back to reference J. Guo, H. Zhang, Z. He, S. Li, Z. Li, J. Mater. Sci.: Mater. Electron. 29, 2491–2499 (2018) J. Guo, H. Zhang, Z. He, S. Li, Z. Li, J. Mater. Sci.: Mater. Electron. 29, 2491–2499 (2018)
11.
go back to reference M. Schubert, C. Münch, S. Schuurman, V. Poulain, J. Kita, R. Moos, J. Eur. Ceram. Soc. 38, 613–619 (2018)CrossRef M. Schubert, C. Münch, S. Schuurman, V. Poulain, J. Kita, R. Moos, J. Eur. Ceram. Soc. 38, 613–619 (2018)CrossRef
12.
go back to reference C. Ma, H. Gao, J. Mater. Sci.: Mater. Electron. 28, 6699–6703 (2017) C. Ma, H. Gao, J. Mater. Sci.: Mater. Electron. 28, 6699–6703 (2017)
13.
go back to reference J. Wu, Z.M. Huang, W. Zhou, C. Ouyang, Y. Hou, Y.Q. Gao, R. Chen, J.H. Chu, J. Appl. Phys. 115, 113703 (2014)CrossRef J. Wu, Z.M. Huang, W. Zhou, C. Ouyang, Y. Hou, Y.Q. Gao, R. Chen, J.H. Chu, J. Appl. Phys. 115, 113703 (2014)CrossRef
14.
go back to reference D.F. Li, S.X. Zhao, K. Xiong, H.Q. Bao, C.W. Nan, J. Alloys Compd. 582, 283–288 (2014)CrossRef D.F. Li, S.X. Zhao, K. Xiong, H.Q. Bao, C.W. Nan, J. Alloys Compd. 582, 283–288 (2014)CrossRef
15.
go back to reference M. Guan, J. Yao, W. Kong, J. Wang, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 5082–5086 (2017) M. Guan, J. Yao, W. Kong, J. Wang, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 5082–5086 (2017)
16.
go back to reference D.G. Wiendartun, Syarif. J. Phys. 812, 012120 (2017) D.G. Wiendartun, Syarif. J. Phys. 812, 012120 (2017)
17.
go back to reference J. Zhang, W. Kong, A. Chang, J. Mater. Sci.: Mater. Electron. 29, 9613–9620 (2018) J. Zhang, W. Kong, A. Chang, J. Mater. Sci.: Mater. Electron. 29, 9613–9620 (2018)
18.
go back to reference Z. He, Z. Li, Q. Xiang, W. Yan, H. Zhang, Int. J. Appl. Ceram. Technol. 16, 160–169 (2019)CrossRef Z. He, Z. Li, Q. Xiang, W. Yan, H. Zhang, Int. J. Appl. Ceram. Technol. 16, 160–169 (2019)CrossRef
20.
go back to reference J. Zhang, H. Zhang, B. Yang, Y. Zhang, Z. Li, J. Mater. Sci.: Mater. Electron. 27, 4935–4942 (2016) J. Zhang, H. Zhang, B. Yang, Y. Zhang, Z. Li, J. Mater. Sci.: Mater. Electron. 27, 4935–4942 (2016)
21.
go back to reference B. Yang, H. Zhang, J. Zhang, X. Zhang, Z. Li, J. Mater. Sci.: Mater. Electron. 26, 10151–10158 (2015) B. Yang, H. Zhang, J. Zhang, X. Zhang, Z. Li, J. Mater. Sci.: Mater. Electron. 26, 10151–10158 (2015)
22.
go back to reference X. Sun, S. Leng, H. Zhang, Z. He, Z. Li, J. Alloys Compd. 763, 975–982 (2018)CrossRef X. Sun, S. Leng, H. Zhang, Z. He, Z. Li, J. Alloys Compd. 763, 975–982 (2018)CrossRef
23.
go back to reference X. Sun, Z. Li, W. Fu, S. Chen, H. Zhang, J. Mater. Sci.: Mater. Electron. 29, 343–350 (2018) X. Sun, Z. Li, W. Fu, S. Chen, H. Zhang, J. Mater. Sci.: Mater. Electron. 29, 343–350 (2018)
24.
go back to reference T. Yang, B. Zhang, P. Luo, Q. Zhao, D. He, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 7558–7561 (2017) T. Yang, B. Zhang, P. Luo, Q. Zhao, D. He, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 7558–7561 (2017)
25.
go back to reference P. Luo, B. Zhang, Q. Zhao, D. He, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 9265–9271 (2017) P. Luo, B. Zhang, Q. Zhao, D. He, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 9265–9271 (2017)
26.
go back to reference H. Zhang, T. Liu, L. Zhao, H. Jiang, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 14195–14201 (2017) H. Zhang, T. Liu, L. Zhao, H. Jiang, A. Chang, J. Mater. Sci.: Mater. Electron. 28, 14195–14201 (2017)
27.
go back to reference R. Zhang, C. Chen, K. Jin, L. Niu, H. Xing, B. Luo, J. Electroceram. 32, 187–191 (2013)CrossRef R. Zhang, C. Chen, K. Jin, L. Niu, H. Xing, B. Luo, J. Electroceram. 32, 187–191 (2013)CrossRef
28.
go back to reference M. Shang, C. Zhang, T. Zhang, L. Yuan, L. Ge, H. Yuan, S. Feng, Appl. Phys. Lett. 102, 062903 (2013)CrossRef M. Shang, C. Zhang, T. Zhang, L. Yuan, L. Ge, H. Yuan, S. Feng, Appl. Phys. Lett. 102, 062903 (2013)CrossRef
29.
go back to reference Y. Zhang, J. Feng, J. Xu, G. Chen, Z. Hong, Integr. Ferroelectr. 151, 108–115 (2014)CrossRef Y. Zhang, J. Feng, J. Xu, G. Chen, Z. Hong, Integr. Ferroelectr. 151, 108–115 (2014)CrossRef
30.
31.
go back to reference C. Zhang, X. Wang, Z. Wang, H. Yan, H. Li, L. Li, Ceram. Int. 42, 19461–19465 (2016)CrossRef C. Zhang, X. Wang, Z. Wang, H. Yan, H. Li, L. Li, Ceram. Int. 42, 19461–19465 (2016)CrossRef
34.
35.
go back to reference C.K. Suman, K. Prasad, R.N.P. Choudhary, Bull. Mater. Sci. 27, 547–553 (2004)CrossRef C.K. Suman, K. Prasad, R.N.P. Choudhary, Bull. Mater. Sci. 27, 547–553 (2004)CrossRef
36.
37.
go back to reference S.K. Rout, S. Parida, E. Sinha, P.K. Barhai, I.W. Kim, Curr. Appl. Phys. 10, 917–922 (2010)CrossRef S.K. Rout, S. Parida, E. Sinha, P.K. Barhai, I.W. Kim, Curr. Appl. Phys. 10, 917–922 (2010)CrossRef
38.
40.
go back to reference K.M. Sangwan, N. Ahlawat, S. Rani, S. Rani, R.S. Kundu, Ceram. Int. 44, 10315–10321 (2018)CrossRef K.M. Sangwan, N. Ahlawat, S. Rani, S. Rani, R.S. Kundu, Ceram. Int. 44, 10315–10321 (2018)CrossRef
Metadata
Title
Electrical properties of perovskite YFeO3 based ceramics modified by Cu/Nb ions as negative temperature coefficient thermistors
Authors
Yuan Zeng
Zhicheng Li
Junming Shao
Xianchi Wang
Wenbin Hao
Hong Zhang
Publication date
08-07-2019
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 15/2019
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-019-01824-w

Other articles of this Issue 15/2019

Journal of Materials Science: Materials in Electronics 15/2019 Go to the issue