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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 12/2001

01-12-2001

Ellipsometry study of InN thin films prepared by magnetron sputtering

Authors: F. Li, D. Mo, C. B. Cao, Y. L. Zhang, H. L. W. Chan, C. L. Choy

Published in: Journal of Materials Science: Materials in Electronics | Issue 12/2001

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Metadata
Title
Ellipsometry study of InN thin films prepared by magnetron sputtering
Authors
F. Li
D. Mo
C. B. Cao
Y. L. Zhang
H. L. W. Chan
C. L. Choy
Publication date
01-12-2001
Publisher
Kluwer Academic Publishers
Published in
Journal of Materials Science: Materials in Electronics / Issue 12/2001
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1023/A:1012992810476

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