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1984 | OriginalPaper | Chapter

Energy Distribution of Secondary Ions Emitted from Silicate Minerals

Authors : J. Okano, H. Nishimura

Published in: Secondary Ion Mass Spectrometry SIMS IV

Publisher: Springer Berlin Heidelberg

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One of the approaches to clarify the emission mechanism of secondary ions is to study the kinetic energy distribution (ED). THOMPSON [1] proposed that the most probable energy Em is near Eb/2, where Eb is the binding energy for metal targets. SIGMUND [2] discussed the nature of the binding energy and proposed to take sublimation energy as Eb for metals and cohesive energy per atom for covalent crystals. SCHROEER [3] deduced a formula for the ionization efficiency of sputtered atoms from metals based on a quantum mechanical model. Using the Schroeer result, GRIES and RUEDENAUER [4] obtained an expression for the ED of secondary ions which leads to Em=0.768Eb for metals.

Metadata
Title
Energy Distribution of Secondary Ions Emitted from Silicate Minerals
Authors
J. Okano
H. Nishimura
Copyright Year
1984
Publisher
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-82256-8_22