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Semiconductors
Published in: Semiconductors 11/2018

01-11-2018 | XXII INTERNATIONAL SYMPOSIUM “NANOPHYSICS AND NANOELECTRONICS”, NIZHNY NOVGOROD, MARCH 12–15, 2018

Experimental Study of Spontaneous-Emission Enhancement in Tamm Plasmon Structures with an Organic Active Region

Authors: K. M. Morozov, K. A. Ivanov, N. Selenin, S. Mikhrin, D. de Sa Pereira, C. Menelaou, A. P. Monkman, M. A. Kaliteevski

Published in: Semiconductors | Issue 11/2018

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Abstract

Spontaneous-emission enhancement in a Tamm plasmon microcavity with an active region with organic material 4.4'-bis(N-carbazolyl)-1.1'-biphenyl (CBP) is theoretically and experimentally studied. The microcavity consisted of a Bragg reflector made of silicon oxide and tantalum oxide, over which CBP and silver layers are applied. The dependences of the Purcell modal factor on the emission direction and frequency, as well as the Purcell factor spectrum are calculated. The emission and fluorescence decay spectra in time are measured in the ultraviolet range. It is found that the probability of spontaneous emission increases and the maximum Purcell factor reaches three at frequencies corresponding to eigenmodes of the Tamm plasmon.
previous article Phosphorus-Based Nanowires Grown by Molecular-Beam Epitaxy on Silicon
next article Modification of the Ferromagnetic Properties of Si1 –xMnx Thin Films Synthesized by Pulsed Laser Deposition with a Variation in the Buffer-Gas Pressure

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Metadata
Title
Experimental Study of Spontaneous-Emission Enhancement in Tamm Plasmon Structures with an Organic Active Region
Authors
K. M. Morozov
K. A. Ivanov
N. Selenin
S. Mikhrin
D. de Sa Pereira
C. Menelaou
A. P. Monkman
M. A. Kaliteevski
Publication date
01-11-2018
Publisher
Pleiades Publishing
Published in
Semiconductors / Issue 11/2018
Print ISSN: 1063-7826
Electronic ISSN: 1090-6479
DOI
https://doi.org/10.1134/S1063782618110155

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