Advertisement
Published in:
2014 | OriginalPaper | Chapter
Fast Adaptive Processing of Low Quality Fringe Patterns by Automated Selective Reconstruction and Enhanced Fast Empirical Mode Decomposition
Authors : Krzysztof Patorski, Maciej Trusiak, Maciej Wielgus
Published in: Fringe 2013
Publisher: Springer Berlin Heidelberg
Activate our intelligent search to find suitable subject content or patents.
Select sections of text to find matching patents with Artificial Intelligence. powered by
Select sections of text to find additional relevant content using AI-assisted search. powered by
Optical fringe pattern processing and analysis [1] plays crucial role in metrological applications (e.g., interferometry, moiré and structured illumination methods). It might be often a troublesome task because of fringe pattern defects such as noise, uneven background, low modulation and generally complex fringe shapes in a wide spatial frequency range. In this paper we present adaptive optical fringe pattern processing (filtering and normalization) techniques, robust to mentioned pattern imperfections, based on the empirical mode decomposition (EMD).