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Fast Adaptive Processing of Low Quality Fringe Patterns by Automated Selective Reconstruction and Enhanced Fast Empirical Mode Decomposition

  • 2014
  • OriginalPaper
  • Chapter
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Abstract

Optical fringe pattern processing and analysis [1] plays crucial role in metrological applications (e.g., interferometry, moiré and structured illumination methods). It might be often a troublesome task because of fringe pattern defects such as noise, uneven background, low modulation and generally complex fringe shapes in a wide spatial frequency range. In this paper we present adaptive optical fringe pattern processing (filtering and normalization) techniques, robust to mentioned pattern imperfections, based on the empirical mode decomposition (EMD).

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Title
Fast Adaptive Processing of Low Quality Fringe Patterns by Automated Selective Reconstruction and Enhanced Fast Empirical Mode Decomposition
Authors
Krzysztof Patorski
Maciej Trusiak
Maciej Wielgus
Copyright Year
2014
Publisher
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-36359-7_25