2014 | OriginalPaper | Buchkapitel
Fast Adaptive Processing of Low Quality Fringe Patterns by Automated Selective Reconstruction and Enhanced Fast Empirical Mode Decomposition
verfasst von : Krzysztof Patorski, Maciej Trusiak, Maciej Wielgus
Erschienen in: Fringe 2013
Verlag: Springer Berlin Heidelberg
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Optical fringe pattern processing and analysis [1] plays crucial role in metrological applications (e.g., interferometry, moiré and structured illumination methods). It might be often a troublesome task because of fringe pattern defects such as noise, uneven background, low modulation and generally complex fringe shapes in a wide spatial frequency range. In this paper we present adaptive optical fringe pattern processing (filtering and normalization) techniques, robust to mentioned pattern imperfections, based on the empirical mode decomposition (EMD).