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Journal of Materials Science: Materials in Electronics

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01-07-2015

Frequency dependent impedance and admittance (immittance) data-handling and interpretation using complex plane formalisms via nonlinear regression analysis for smart electronic materials and devices: overview and case studies

Authors: Sudip Bhattacharjee, Mohammad A. Alim

Published in: Journal of Materials Science: Materials in Electronics | Issue 7/2015

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Abstract

The ac small-signal electrical data handling criteria are discussed with the real-world examples. Both Debye (ideal) and non-Debye (non-ideal) relaxations via semicircular loci in the complex plane formalisms are discussed. Detailed discussion on the analytical methods emphasized both geometric and complex nonlinear least squares (CNLS) fitting procedures. It is shown that the large data collection having small interval within the successive frequencies aids in the accuracy of the methods via matching sets of extracted parameters. For fewer data collection having wide gap in the successive frequencies, two analytical methods do not match for the extracted parameters. It is visualized that both methods are valid and lead to the accuracy to investigate novel electronic materials and devices. The geometric method yields the parameters whereas the CNLS method assumes the parameters for exact fitting.

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Title: Frequency dependent impedance and admittance (immittance) data-handling and interpretation using complex plane formalisms via nonlinear regression analysis for smart electronic materials and devices: overview and case studies
Authors: Sudip Bhattacharjee
Mohammad A. Alim
Publication date: 01-07-2015
Publisher: Springer US
Published in: Journal of Materials Science: Materials in Electronics / Issue 7/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI: https://doi.org/10.1007/s10854-015-3034-z

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