Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 12/2018

02-04-2018

Influence of different sulfur sources on the phase formation of Cu2ZnSnS4 (CZTS) nanoparticles (NPs)

Authors: C. Imla Mary, M. Senthilkumar, S. Moorthy Babu

Published in: Journal of Materials Science: Materials in Electronics | Issue 12/2018

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

Wurtzite (Wz) and kesterite (Ks) phases of Cu2ZnSnS4 (CZTS) nanoparticles (NPs) have been selectively synthesized via hot injection method using 1-octadecene (1-ODE) as solvent. The solvents, 1-dodecanethiol (1-DDT) and tert-dodecanethiol (t-DDT) were utilized to control the reactivity of metal precursors and to tune the desirable crystallographic phases. The phase purity of the as synthesized CZTS NPs was confirmed using X-ray diffraction results. TEM images indicate that the developed nanoparticles consist of a mixture of triangular shaped (height 20 ± 3 nm, width 17 ± 2 nm) and sphere shaped NPs (13.4 ± 0.4 nm). These nanoparticles were formed due to the influence of thiols without any additional capping ligands. The band gap of as-synthesized CZTS NPs were calculated as 1.41 eV for wurtzite phase (Wz—1-DDT) and 1.47 eV for kesterite phase (Ks—t-DDT) from UV–Visible absorption results. CZTS thin films were prepared via spin coating and the electrical properties were analysed using Hall Effect measurements. Both the phases of CZTS films exhibit p-type conductivity. Wurtzite phase of CZTS has higher mobility (23.6 cm−3) and carrier concentration (2.64 × 1017) compared to kesterite phase of CZTS films.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
1.
go back to reference M.A. Green, K. Emery, Y. Hishikawa, W. Warta, Prog. Photovolt. Res. Appl. 19, 84–92 (2011)CrossRef M.A. Green, K. Emery, Y. Hishikawa, W. Warta, Prog. Photovolt. Res. Appl. 19, 84–92 (2011)CrossRef
2.
go back to reference P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischman, M. Powalla, Prog. Photovolt. Res. Appl. 19, 894–897 (2011)CrossRef P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischman, M. Powalla, Prog. Photovolt. Res. Appl. 19, 894–897 (2011)CrossRef
3.
go back to reference M.-H. Jao, H.-C. Liao, M.-C. Wu, W.-F. Su, Jpn. J. Appl. Phys. 51, 10NC30 (2012)CrossRef M.-H. Jao, H.-C. Liao, M.-C. Wu, W.-F. Su, Jpn. J. Appl. Phys. 51, 10NC30 (2012)CrossRef
4.
go back to reference S.W. Shin, J.H. Han, Y.C. Park, G. Agawane, C.H. Jeong, J.H. Yun, A.V. Moholkar, J.Y. Lee, J.H. Kim, J. Mater. Chem. 22, 21727 (2012)CrossRef S.W. Shin, J.H. Han, Y.C. Park, G. Agawane, C.H. Jeong, J.H. Yun, A.V. Moholkar, J.Y. Lee, J.H. Kim, J. Mater. Chem. 22, 21727 (2012)CrossRef
5.
go back to reference U. Ghorpade, M. Suryawanshi, S.W. Shin, K. Gurav, P. Patil, S. Pawar, C.W. Hang, J.H. Kim, S. Kolekar, Chem. Commun. 50, 11258–11273 (2014)CrossRef U. Ghorpade, M. Suryawanshi, S.W. Shin, K. Gurav, P. Patil, S. Pawar, C.W. Hang, J.H. Kim, S. Kolekar, Chem. Commun. 50, 11258–11273 (2014)CrossRef
6.
go back to reference D. Xia, P. Lei, Y. Zheng, B. Zhou, J. Mater. Sci.: Mater. Electron. 26, 5426–5432 (2015) D. Xia, P. Lei, Y. Zheng, B. Zhou, J. Mater. Sci.: Mater. Electron. 26, 5426–5432 (2015)
7.
go back to reference V.A. Madiraju, K. Taneja, M. Kumar, R. Seelaboyina, J. Mater. Sci.: Mater. Electron. 27, 3152–3157 (2016) V.A. Madiraju, K. Taneja, M. Kumar, R. Seelaboyina, J. Mater. Sci.: Mater. Electron. 27, 3152–3157 (2016)
8.
go back to reference S.W. Shin, J.H. Han, Y.C. Park, G.L. Agawane, C.H. Jeong, J.H. Yun, A.V. Moholkar, J.Y. Lee, J.H. Kim, J. Mater. Chem. 22, 21727–21732 (2012)CrossRef S.W. Shin, J.H. Han, Y.C. Park, G.L. Agawane, C.H. Jeong, J.H. Yun, A.V. Moholkar, J.Y. Lee, J.H. Kim, J. Mater. Chem. 22, 21727–21732 (2012)CrossRef
9.
go back to reference S.A. Vanalakar, G.L. Agwane, M.G. Gang, P.S. Patil, J.H. Kim, J.Y. Kim, Phys. Status. Solidi C 12, 500–503 (2015)CrossRef S.A. Vanalakar, G.L. Agwane, M.G. Gang, P.S. Patil, J.H. Kim, J.Y. Kim, Phys. Status. Solidi C 12, 500–503 (2015)CrossRef
10.
go back to reference W. Wang, M.T. Winkler, O. Gunawan, T. Gokmen, T.K. Todorov, Y. Zhu, D.B. Mitzi, Adv. Energy. Mater. 4, 1301465 (2014)CrossRef W. Wang, M.T. Winkler, O. Gunawan, T. Gokmen, T.K. Todorov, Y. Zhu, D.B. Mitzi, Adv. Energy. Mater. 4, 1301465 (2014)CrossRef
11.
go back to reference Q. Guo, G.M. Ford, W.C. Yang, B.C. Walker, E.A. Stach, H.W. Hillhouse, R. Agrawal, J. Am. Chem. Soc. 132, 17384–17386 (2010)CrossRef Q. Guo, G.M. Ford, W.C. Yang, B.C. Walker, E.A. Stach, H.W. Hillhouse, R. Agrawal, J. Am. Chem. Soc. 132, 17384–17386 (2010)CrossRef
12.
13.
14.
15.
go back to reference J. Kong, Z.-J. Zhou, M. Li, W.-H. Zhou, S.-J. Yuan, R.-Y. Yao, Y. Zhao, S.-X. Wu, Nanoscale Res. Lett. 8, 464 (2013)CrossRef J. Kong, Z.-J. Zhou, M. Li, W.-H. Zhou, S.-J. Yuan, R.-Y. Yao, Y. Zhao, S.-X. Wu, Nanoscale Res. Lett. 8, 464 (2013)CrossRef
16.
go back to reference M. Kruszynska, H. Borchert, J. Parisi, J.K. Olesika, J. Am. Chem. Soc. 132, 15976–15986 (2010)CrossRef M. Kruszynska, H. Borchert, J. Parisi, J.K. Olesika, J. Am. Chem. Soc. 132, 15976–15986 (2010)CrossRef
17.
go back to reference S. Ananthakumar, J. Ramkumar, Y. Hayakawa, S. Moorthy Babu, Jpn. J. Appl. Phys. 54, 08KA10 (2015)CrossRef S. Ananthakumar, J. Ramkumar, Y. Hayakawa, S. Moorthy Babu, Jpn. J. Appl. Phys. 54, 08KA10 (2015)CrossRef
18.
go back to reference Z. Li, A.L.K. Lui, K.H. Lam, L. Xi, Y.M. Lam, Inorg. Chem. 53, 10874–10880 (2014)CrossRef Z. Li, A.L.K. Lui, K.H. Lam, L. Xi, Y.M. Lam, Inorg. Chem. 53, 10874–10880 (2014)CrossRef
19.
go back to reference M.D. Regulacio, C. Ye, S.H. Lim, M. Bosman, E. Ye, Chem. Eur. J. 18, 3127–3131 (2014)CrossRef M.D. Regulacio, C. Ye, S.H. Lim, M. Bosman, E. Ye, Chem. Eur. J. 18, 3127–3131 (2014)CrossRef
20.
go back to reference M. Li, W.-H. Zhou, J. Guo, Y.-L. Zhou, Z.-L. Hou, J. Jiao, Z.-J. Zhou, Z.-L. Du, S.-X. Wu, J. Phys. Chem. C 116, 26507–26516 (2012)CrossRef M. Li, W.-H. Zhou, J. Guo, Y.-L. Zhou, Z.-L. Hou, J. Jiao, Z.-J. Zhou, Z.-L. Du, S.-X. Wu, J. Phys. Chem. C 116, 26507–26516 (2012)CrossRef
21.
23.
25.
go back to reference C. Dablemont, P. Lang, C. Mangeney, J.Y. Piquemal, V. Petkov, F. Herbst, G. Viau, Langmuir 24, 5832–5841 (2008)CrossRef C. Dablemont, P. Lang, C. Mangeney, J.Y. Piquemal, V. Petkov, F. Herbst, G. Viau, Langmuir 24, 5832–5841 (2008)CrossRef
26.
go back to reference A. Singh, H. Geaney, F. Laffir, K.M. Ryan, J. Am. Chem. 134, 2910–2913 (2012)CrossRef A. Singh, H. Geaney, F. Laffir, K.M. Ryan, J. Am. Chem. 134, 2910–2913 (2012)CrossRef
27.
28.
go back to reference C. Steinhagen, M.G. Panthani, V. Akhavan, B. Goodfellow, B. Koo, B.A. Korgel, J. Am. Chem. Soc. 131, 12554–12555 (2009)CrossRef C. Steinhagen, M.G. Panthani, V. Akhavan, B. Goodfellow, B. Koo, B.A. Korgel, J. Am. Chem. Soc. 131, 12554–12555 (2009)CrossRef
29.
30.
go back to reference J. Zhi, W. Shurong, L. Zhishan, Y. Min, L. Sijia, L. Yilei, Z. Qichen, H. Ruiting, Mat. Sci. Semin. Proc. 57, 239–243 (2017)CrossRef J. Zhi, W. Shurong, L. Zhishan, Y. Min, L. Sijia, L. Yilei, Z. Qichen, H. Ruiting, Mat. Sci. Semin. Proc. 57, 239–243 (2017)CrossRef
31.
go back to reference M. Shakban, P.D. Matthews, N. Savjani, X.L. Zhong, Y. Wang, M. Missous, P. O’Brien, J. Mater. Sci. 52, 12761–12771 (2017)CrossRef M. Shakban, P.D. Matthews, N. Savjani, X.L. Zhong, Y. Wang, M. Missous, P. O’Brien, J. Mater. Sci. 52, 12761–12771 (2017)CrossRef
32.
go back to reference A. Aldalbahi, E.M. Mkawi, K. Ibrahim, M.A. Farrukh, Sci. Rep. 6, 32431 (2016)CrossRef A. Aldalbahi, E.M. Mkawi, K. Ibrahim, M.A. Farrukh, Sci. Rep. 6, 32431 (2016)CrossRef
Metadata
Title
Influence of different sulfur sources on the phase formation of Cu2ZnSnS4 (CZTS) nanoparticles (NPs)
Authors
C. Imla Mary
M. Senthilkumar
S. Moorthy Babu
Publication date
02-04-2018
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 12/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-9013-4

Other articles of this Issue 12/2018

Journal of Materials Science: Materials in Electronics 12/2018 Go to the issue