Skip to main content
Top
Published in: Journal of Materials Science: Materials in Electronics 1/2017

31-08-2016

Influence of latent heat released from solder joints II: PCB deformation during reflow and pad cratering defects

Authors: Karel Dušek, Alexandra Rudajevová

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2017

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

This work is focused on the deformation of FR4 laminate, a material used to form many basic components of electronic assemblies, during the reflow process. The thermal expansion of FR4 was assessed from room temperature up to 250 °C. The dilatation characteristics of the laminate were found to be highly anisotropic in three directions. Special attention was paid to the irreversible changes in the laminate after the first thermal cycle, and the results were used to analyze the effects of latent heat on the deformation of FR4 during reflow. The latent heat released during solidification of a solder joint heats not only the joint but also its surrounding, leading to localized expansion of all materials around the joint and potentially causing pad cratering. Thermal expansion measurements demonstrated that the coefficient of thermal expansion (CTE) of the FR4 laminate in the z direction was at least 10 times that of the adjacent materials in the electronics assembly. This large difference in the CTE leads to residual strains in the assembly. An analysis of this problem is presented, and a model for the effect of latent heat on the FR4 deformation is proposed.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Springer Professional "Wirtschaft"

Online-Abonnement

Mit Springer Professional "Wirtschaft" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 340 Zeitschriften

aus folgenden Fachgebieten:

  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Versicherung + Risiko




Jetzt Wissensvorsprung sichern!

Literature
3.
go back to reference J.-W. Yoon, B.-I. Noh, J.-H. Yoon, H.-B. Kang, S.-B. Jung, J. Alloys Compd. 509, L153 (2011)CrossRef J.-W. Yoon, B.-I. Noh, J.-H. Yoon, H.-B. Kang, S.-B. Jung, J. Alloys Compd. 509, L153 (2011)CrossRef
5.
go back to reference R. Osiroff, D.P.H. Hasselman, J. Compos. Mater. 25, 1588 (1991) R. Osiroff, D.P.H. Hasselman, J. Compos. Mater. 25, 1588 (1991)
7.
8.
9.
go back to reference P. Geng, T. Bandorawalla, S. Cho, H. Hsiao, J. Kuchy, G. Long, R. Martinson, A. Mcallister, M. Mello, K. Meyyappan, R. Williams, L. Zhu, in Proceedings of the 56th Electronic Components and Technology Conference (2006) P. Geng, T. Bandorawalla, S. Cho, H. Hsiao, J. Kuchy, G. Long, R. Martinson, A. Mcallister, M. Mello, K. Meyyappan, R. Williams, L. Zhu, in Proceedings of the 56th Electronic Components and Technology Conference (2006)
10.
11.
12.
go back to reference M. Placek, K. Dusek, J. Urbanek, in Proceedings of the 2014 37th International Spring Seminar on Electronics Technology ISSE (2014), pp. 193–197 M. Placek, K. Dusek, J. Urbanek, in Proceedings of the 2014 37th International Spring Seminar on Electronics Technology ISSE (2014), pp. 193–197
13.
go back to reference K.S. Kim, C.H. Yu, S.W. Han, K.C. Yang, J.H. Kim, Microelectron. Reliab. 48, 111 (2008)CrossRef K.S. Kim, C.H. Yu, S.W. Han, K.C. Yang, J.H. Kim, Microelectron. Reliab. 48, 111 (2008)CrossRef
14.
15.
16.
go back to reference A. Geczy, L. Tersztyanszky, B. Illes, A. Kemler, and A. Szabo, in Design and Technology in Electronic Packaging SIITME, 2013 IEEE 19th International Symposium for Design and Technology (2013), pp. 65–68 A. Geczy, L. Tersztyanszky, B. Illes, A. Kemler, and A. Szabo, in Design and Technology in Electronic Packaging SIITME, 2013 IEEE 19th International Symposium for Design and Technology (2013), pp. 65–68
17.
go back to reference Attila Geczy, Márta Fejos, László Tersztyánszky, Solder. Surf. Mt. Technol. 27, 61 (2015)CrossRef Attila Geczy, Márta Fejos, László Tersztyánszky, Solder. Surf. Mt. Technol. 27, 61 (2015)CrossRef
18.
go back to reference K. Dušek, A. Rudajevová, M. Plaček, J. Mater. Sci. Mater. Electron. 27, 543 (2015) K. Dušek, A. Rudajevová, M. Plaček, J. Mater. Sci. Mater. Electron. 27, 543 (2015)
20.
go back to reference A. Rudajevova, K. Dusek, Kov. Mater. Met. Mater. 50, 295 (2012) A. Rudajevova, K. Dusek, Kov. Mater. Met. Mater. 50, 295 (2012)
22.
go back to reference H. Ma, W. Xie, G. Subbarayan, K.-C. Liu, in IEEE 61st Electronic Components and Technology Conference (ECTC) (2011), pp. 979–983 H. Ma, W. Xie, G. Subbarayan, K.-C. Liu, in IEEE 61st Electronic Components and Technology Conference (ECTC) (2011), pp. 979–983
23.
go back to reference M. Mukadam, G. Long, P. Butler, V. Vasudevan, in Proceedings of SMTA International (2005), pp. 324–329 M. Mukadam, G. Long, P. Butler, V. Vasudevan, in Proceedings of SMTA International (2005), pp. 324–329
24.
go back to reference T.T. Mattila, P. Marjamaki, J.K. Kivilahti, IEEE Trans, Compon. Packag. Technol. 29, 787 (2006)CrossRef T.T. Mattila, P. Marjamaki, J.K. Kivilahti, IEEE Trans, Compon. Packag. Technol. 29, 787 (2006)CrossRef
25.
go back to reference K. Newman, in International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Microelectronics and Microsystems. 2008 EuroSimE 2008 (2008), pp. 1–15 K. Newman, in International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Microelectronics and Microsystems. 2008 EuroSimE 2008 (2008), pp. 1–15
Metadata
Title
Influence of latent heat released from solder joints II: PCB deformation during reflow and pad cratering defects
Authors
Karel Dušek
Alexandra Rudajevová
Publication date
31-08-2016
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2017
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-016-5630-y

Other articles of this Issue 1/2017

Journal of Materials Science: Materials in Electronics 1/2017 Go to the issue