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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 8/2013

01-08-2013

Interdiffusion study in the Pd–Pt system

Authors: Varun A. Baheti, Raju Ravi, Aloke Paul

Published in: Journal of Materials Science: Materials in Electronics | Issue 8/2013

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Abstract

Interdiffusion, intrinsic, tracer and impurity diffusion coefficients are calculated in the Pd–Pt system. Interdiffusion coefficients are more or less insensitive to composition change. Activation energy varies in the range of 324–353 kJ/mol. Impurity diffusion coefficients calculated in this study and available tracer diffusion coefficients in pure elements indicate that Pd has higher diffusion rate compared to Pt in pure Pd, whereas, both the elements have similar diffusion rates in Pt. Kirkendall marker experiments indicate that Pd has much higher diffusion rate in Pd3.5at.%Pt compared to Pt.
previous article Solid-state reaction synthesized Pd-doped tin oxide thick film sensor for detection of H2, CO, LPG and CH4
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Metadata
Title
Interdiffusion study in the Pd–Pt system
Authors
Varun A. Baheti
Raju Ravi
Aloke Paul
Publication date
01-08-2013
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 8/2013
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-013-1179-1

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