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Open Access 06-04-2017

Investigation of Si and O Donor Impurities in Unintentionally Doped MBE-Grown GaN on SiC(0001) Substrate

Authors: Tobias Tingberg, Tommy Ive, Anders Larsson

Title: Investigation of Si and O Donor Impurities in Unintentionally Doped MBE-Grown GaN on SiC(0001) Substrate
Authors: Tobias Tingberg
Tommy Ive
Anders Larsson
Publication date: 06-04-2017
Publisher: Springer US
Published in: Journal of Electronic Materials / Issue 8/2017
Print ISSN: 0361-5235
Electronic ISSN: 1543-186X
DOI: https://doi.org/10.1007/s11664-017-5484-y