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Semiconductors

11-10-2023 | SURFACES, INTERFACES, AND THIN FILMS

Investigation of Structure, First Order Optical Susceptibility, Non-Linear Optical, Electrical Susceptibility Results, and IV Characterizations of Graphene Multilayer

Authors: A. Abdel Moez, M. A. Salem, H. A. Elmeleegi, Z. S. Elmandouh

Published in: Semiconductors

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Abstract

Graphene sample was synthesized using pulsed laser deposition technique. The structure for graphene sample was investigated using both of transmission electron microscopy, for powder graphene, diffraction electron microscopy, and X-ray diffraction technique for thin film. The first order of moment M–1 and the third order of moment M–3 were determined optically. The linear optical susceptibility χ(1) for this sample was determined. Non-linear optical parameters such as third-order non-linear optical susceptibility χ(3), non-linear absorption coefficient βc, and non-linear refractive index n2 were determined for this sample. The electrical susceptibility χe and relative permittivity εr were calculated. The electronic results such as density of valence band, density of conduction band, and Fermi level position were determined. IV Characterizations for this sample were studied in case of forward and reverse current and in case of darkness and illumination.

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Metadata
Title
Investigation of Structure, First Order Optical Susceptibility, Non-Linear Optical, Electrical Susceptibility Results, and IV Characterizations of Graphene Multilayer
Authors
A. Abdel Moez
M. A. Salem
H. A. Elmeleegi
Z. S. Elmandouh
Publication date
11-10-2023
Publisher
Pleiades Publishing
Published in
Semiconductors
Print ISSN: 1063-7826
Electronic ISSN: 1090-6479
DOI
https://doi.org/10.1134/S1063782621060075

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