Issue 5/2002
Content (12 Articles)
Study of the effect of trap levels on steady-state dark I–V characteristics in Safranine-T-based solid-state thin film photoelectrochemical cell
Sisir Kumar Dey, Md. Rabiul Islam, N. B. Manik, A. N. Basu
Varistor behavior of the system SnO2ċCoOċTa2O5ċCr2O3
G. F. Menegotto, S. A. Pianaro, A. J. Zara, S. R. M. Antunes, A. C. Antunes
Electrical properties of r.f. magnetron sputtered BaxSr1−xTiO3 films on multi-layered bottom electrodes for high-density memory application
B. Panda, C. B. Samantaray, A. Dhar, S. K. Ray, D. Bhattacharya
Estimation of liquidus temperature of Sn-based alloys and its application to the design of Pb-free solder
H. Ezaki, T. Nambu, R. Ninomiya, Y. Nakahara, C. Q. Wang, M. Morinaga
Magnetic hysteresis and domain states in Li1+ substituted Ni–Zn ferrites
S. R. Sawant, D. N. Bhosale, N. D. Chaudhari, P. P. Bakare
Formation of ZnSe1−x S x quantum dots under Volmer–Weber mode
C. X. Shan, X. W. Fan, J. Y. Zhang, Z. Z. Zhang, Y. M. Lu, Y. C. Liu, D. Z. Shen, X. G. Kong
Effects of deionized water pressure and purified nitrogen gas on the chemical mechanical polishing process
Sang-Yong Kim, So-Young Jeong, Yong-Jin Seo
Evolution of microstructure during annealing of low-dose SIMOX wafers implanted at 65 keV
B. Johnson, Jun Sik Jeoung, P. Anderson, Supapan Seraphin