01-01-2013 | Symposium: Neutron and X-Ray Studies of Advanced Materials V
Lattice Defects Diffuse Scattering from Thin Films of a Ge-Si System with Low-Energy Ar+ and Xe+ Bombardment During Molecular Beam Epitaxy (MBE) Growth
Published in: Metallurgical and Materials Transactions A | Issue 1/2013
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