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Acoustic Microscopy Read chapter Read first chapter

2018 | OriginalPaper | Chapter

58. Low-Energy Electron Microscope

Author : H. Hibino

Published in: Compendium of Surface and Interface Analysis

Publisher: Springer Singapore

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Abstract

Low-energy electron microscopy (LEEM) is a projection-type microscopy technique collecting low-energy (typically 1–100 eV) electrons backscattered from the samples for imaging [1].

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previous chapter Low-Energy Electron Diffraction
next chapter Magnetic Force Microscopy
Literature
1.
Bauer, E.: Surface Microscopy with Low Energy Electrons. Springer, New York (2014)CrossRef
2.
Telieps, W., Bauer, E.: An analytical reflection and emission UHV surface electron microscope. Ultramicroscopy 17, 57–65 (1985)CrossRef
3.
McCarty, K.F., Feibelman, P.J., Loginova, E., Bartelt, N.C.: Kinetics and thermodynamics of carbon segregation and graphene growth on Ru(0001). Carbon 47, 1806–1813 (2009)CrossRef
4.
Ogawa, Y., Hu, B., Orofeo, C.M., Tsuji, M., Ikeda, K., Mizuno, S., Hibino, H., Ago, H.: Domain structure and boundary in single-layer graphene grown on Cu(111) and Cu(100) films. J. Phys. Chem. Lett. 3, 219–226 (2012)CrossRef
5.
Hibino, H., Kageshima, H., Maeda, F., Nagase, M., Kobayashi, Y., Yamaguchi, H.: Microscopic thickness determination of thin graphite films formed on SiC from quantized oscillation in reflectivity of low-energy electrons. Phys. Rev. B 77, 075413 (2008)CrossRef
6.
Feenstra, R.M., Srivastava, N., Gao, Q., Widom, M., Diaconescu, B., Ohta, T., Kellogg, G.L., Robinson, J.T., Vlassiouk, I.V.: Low-energy electron reflectivity from graphene. Phys. Rev. B 87, 041406(R) (2013)CrossRef
Metadata
Title
Low-Energy Electron Microscope
Author
H. Hibino
Copyright Year
2018
Publisher
Springer Singapore
Book
Compendium of Surface and Interface Analysis

Print ISBN: 978-981-10-6155-4

Electronic ISBN: 978-981-10-6156-1

Copyright Year: 2018

DOI
https://doi.org/10.1007/978-981-10-6156-1_58

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