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Published in: Journal of Materials Science: Materials in Electronics 3/2010

01-03-2010

Low temperature sintering of Li1.1Nb0.58Ti0.5O3-xBi2O3 dielectric with adjustable temperature coefficient

Authors: Ping Zhang, Lingxia Li, Guochao Li, Wei Zhang

Published in: Journal of Materials Science: Materials in Electronics | Issue 3/2010

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Abstract

Ceramics of Li1.1Nb0.58Ti0.5O3-xBi2O3 with low sintering temperature have been prepared by the solid-solution reaction method using B2O3 (2 wt% added) as sintering aid. For all compounds, the sintering temperature achieves 900 °C. Microstructure and dielectric properties of Li1.1Nb0.58Ti0.5O3-2 wt% B2O3-xBi2O3 (LNT-B-xBi) ceramics have been investigated. The X-ray diffraction patterns indicate for higher Bi2O3 content (x = 0.1 mol%) that the material is composed by two phases identified as M-phase and Bi4Ti3O12. The Li1.1Nb0.58Ti0.5O3 + 0.15 mol% Bi2O3 composition sintered at 900 °C with B2O3 addition exhibits attractive dielectric properties (ε r = 59.68, tan δ = 1.2×10−4 and a temperature coefficient of the relative permittivity near zero) at 1 MHz. It is also shown that the introduction of Bi2O3 can tune the temperature coefficient of the relative permittivity. All dielectric properties lead this system compatible to manufacture sliver based electrodes multilayer dielectric devices.

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Metadata
Title
Low temperature sintering of Li1.1Nb0.58Ti0.5O3-xBi2O3 dielectric with adjustable temperature coefficient
Authors
Ping Zhang
Lingxia Li
Guochao Li
Wei Zhang
Publication date
01-03-2010
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 3/2010
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-009-9894-3

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