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Published in: Metallurgical and Materials Transactions A 3/2015

01-03-2015

Mechanical Behavior of Nano-crystalline Metallic Thin Films and Multilayers Under Microcompression

Authors: Jiangting Wang, Chunhui Yang, Peter D. Hodgson

Published in: Metallurgical and Materials Transactions A | Issue 3/2015

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Abstract

Microcompression tests were performed to determine the mechanical behavior of nano-crystalline Cu/Fe and Fe/Cu multilayers, as well as monolithic Cu and Fe thin films. The results show that the micropillars of pure Cu thin film bulge out under large compressive strains without failure, while those of pure Fe thin film crack near the top at low compressive strains followed by shear failure. For Cu/Fe and Fe/Cu multilayers, the Cu layers accommodate the majority of plastic deformation, and the geometry constraints imposed by Fe layers exaggerates the bulging in the Cu layers. However, the existence of ductile Cu layers does not improve the overall ductility of Cu/Fe and Fe/Cu multilayers. Cracking in the Fe layers directly lead to the failure of the multilayer micropillars, although the Cu layers have very good ductility. The results imply that suppressing the cracking of brittle layers is more important than simply adding ductile layers for improving the overall ductility of metallic multilayers.

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Literature
1.
go back to reference E. Fortunato, P. Barquinha, and R. Martins: Adv. Mater., 2012, vol. 24, pp. 2945-86.CrossRef E. Fortunato, P. Barquinha, and R. Martins: Adv. Mater., 2012, vol. 24, pp. 2945-86.CrossRef
3.
go back to reference M.A. Green: J. Mater. Sci. Mater. Electron., 2007, vol. 18, pp. 15-9. M.A. Green: J. Mater. Sci. Mater. Electron., 2007, vol. 18, pp. 15-9.
4.
go back to reference B. Bhushan: in MEMS/NEMS and BioMEMS/BioNEMS: Materials, Devices, and Biomimetics Nanotribology and Nanomechanics II, B. Bhushan, ed., Springer, Berlin, 2011, pp. 833–945. B. Bhushan: in MEMS/NEMS and BioMEMS/BioNEMS: Materials, Devices, and Biomimetics Nanotribology and Nanomechanics II, B. Bhushan, ed., Springer, Berlin, 2011, pp. 833–945.
7.
go back to reference W.N. Sharpe Jr: The MEMS handbook, 2002, vol. 3, pp. 1-33, CRC, Boca Raton. W.N. Sharpe Jr: The MEMS handbook, 2002, vol. 3, pp. 1-33, CRC, Boca Raton.
8.
go back to reference J.Y. Zhang, X. Zhang, R.H. Wang, S.Y. Lei, P. Zhang, J.J. Niu, G. Liu, G.J. Zhang, and J. Sun: Acta Mater., 2011, vol. 59, pp. 7368-79. J.Y. Zhang, X. Zhang, R.H. Wang, S.Y. Lei, P. Zhang, J.J. Niu, G. Liu, G.J. Zhang, and J. Sun: Acta Mater., 2011, vol. 59, pp. 7368-79.
9.
go back to reference J.Y. Zhang, S. Lei, Y. Liu, J.J. Niu, Y. Chen, G. Liu, X. Zhang, and J. Sun: Acta Mater., 2012, vol. 60, pp. 1610-22. J.Y. Zhang, S. Lei, Y. Liu, J.J. Niu, Y. Chen, G. Liu, X. Zhang, and J. Sun: Acta Mater., 2012, vol. 60, pp. 1610-22.
11.
go back to reference K.J. Hemker, and W.N. Sharpe: Annu. Rev. Mater. Res., 2007, vol. 37, pp. 93-126.CrossRef K.J. Hemker, and W.N. Sharpe: Annu. Rev. Mater. Res., 2007, vol. 37, pp. 93-126.CrossRef
12.
go back to reference O. Kraft, P.A. Gruber, R. Mönig, and D. Weygand: Annu. Rev. Mater. Res., 2010, vol. 40, pp. 293-317.CrossRef O. Kraft, P.A. Gruber, R. Mönig, and D. Weygand: Annu. Rev. Mater. Res., 2010, vol. 40, pp. 293-317.CrossRef
13.
go back to reference M.D. Uchic, P.A. Shade, and D.M. Dimiduk: Annu. Rev. Mater. Res., 2009, vol. 39, pp. 361-86.CrossRef M.D. Uchic, P.A. Shade, and D.M. Dimiduk: Annu. Rev. Mater. Res., 2009, vol. 39, pp. 361-86.CrossRef
14.
go back to reference M. Uchic, D. Dimiduk, J. Florando, and W. Nix: Science, 2004, vol. 305, pp. 986-9.CrossRef M. Uchic, D. Dimiduk, J. Florando, and W. Nix: Science, 2004, vol. 305, pp. 986-9.CrossRef
15.
go back to reference J.R. Greer, W.C. Oliver, and W.D. Nix: Acta Mater., 2005, vol. 53, pp. 1821-30.CrossRef J.R. Greer, W.C. Oliver, and W.D. Nix: Acta Mater., 2005, vol. 53, pp. 1821-30.CrossRef
16.
go back to reference M.C. Liu, J.C. Huang, H.S. Chou, Y.H. Lai, C.J. Lee, and T.G. Nieh: Scr. Mater., 2009, vol. 61, pp. 840-3.CrossRef M.C. Liu, J.C. Huang, H.S. Chou, Y.H. Lai, C.J. Lee, and T.G. Nieh: Scr. Mater., 2009, vol. 61, pp. 840-3.CrossRef
17.
go back to reference M.C. Liu, X.H. Du, I.C. Lin, H.J. Pei, and J.C. Huang: Intermetallics, 2012, vol. 30, pp. 30-4.CrossRef M.C. Liu, X.H. Du, I.C. Lin, H.J. Pei, and J.C. Huang: Intermetallics, 2012, vol. 30, pp. 30-4.CrossRef
18.
go back to reference J.Y. Zhang, S. Lei, J. Niu, Y. Liu, G. Liu, X. Zhang, and J. Sun: Acta Mater., 2012, vol. 60, pp. 4054-64. J.Y. Zhang, S. Lei, J. Niu, Y. Liu, G. Liu, X. Zhang, and J. Sun: Acta Mater., 2012, vol. 60, pp. 4054-64.
19.
go back to reference S.-W. Lee, S.M. Han, and W.D. Nix: Acta Mater., 2009, vol. 57, pp. 4404-15.CrossRef S.-W. Lee, S.M. Han, and W.D. Nix: Acta Mater., 2009, vol. 57, pp. 4404-15.CrossRef
20.
22.
go back to reference M.A. Hopcroft, W.D. Nix, and T.W. Kenny: J. Microelectromech. Syst., 2010, vol. 19, pp. 229-38.CrossRef M.A. Hopcroft, W.D. Nix, and T.W. Kenny: J. Microelectromech. Syst., 2010, vol. 19, pp. 229-38.CrossRef
23.
go back to reference A.R. Yavari, P.J. Desré, and T. Benameur: Phys. Rev. Lett., 1992, vol. 68, pp. 2235-8.CrossRef A.R. Yavari, P.J. Desré, and T. Benameur: Phys. Rev. Lett., 1992, vol. 68, pp. 2235-8.CrossRef
24.
go back to reference E. Gaffet, M. Harmelin, and F. Faudot: J. Alloys Compd., 1993, vol. 194, pp. 23-30.CrossRef E. Gaffet, M. Harmelin, and F. Faudot: J. Alloys Compd., 1993, vol. 194, pp. 23-30.CrossRef
25.
go back to reference G.T. GrayIii, T.C. Lowe, C.M. Cady, R.Z. Valiev, and I.V. Aleksandrov: Nanostruct. Mater., 1997, vol. 9, pp. 477–80.CrossRef G.T. GrayIii, T.C. Lowe, C.M. Cady, R.Z. Valiev, and I.V. Aleksandrov: Nanostruct. Mater., 1997, vol. 9, pp. 477–80.CrossRef
26.
go back to reference M.A. Meyers, A. Mishra, and D.J. Benson: Prog. Mater Sci., 2006, vol. 51, pp. 427-556.CrossRef M.A. Meyers, A. Mishra, and D.J. Benson: Prog. Mater Sci., 2006, vol. 51, pp. 427-556.CrossRef
27.
go back to reference R. SuryanarayananIyer, C.A. Frey, S.M.L. Sastry, B.E. Waller, and W.E. Buhro: Mater. Sci. Eng. A, 1999, vol. 264, pp. 210–14.CrossRef R. SuryanarayananIyer, C.A. Frey, S.M.L. Sastry, B.E. Waller, and W.E. Buhro: Mater. Sci. Eng. A, 1999, vol. 264, pp. 210–14.CrossRef
28.
29.
go back to reference K.Y. Xie, Y. Wang, S. Ni, X. Liao, J.M. Cairney, and S.P. Ringer: Scr. Mater., 2011, vol. 65, pp. 1037-40.CrossRef K.Y. Xie, Y. Wang, S. Ni, X. Liao, J.M. Cairney, and S.P. Ringer: Scr. Mater., 2011, vol. 65, pp. 1037-40.CrossRef
30.
go back to reference F.F. Csikor, C. Motz, D. Weygand, M. Zaiser, and S. Zapperi: Science, 2007, vol. 318, pp. 251-4.CrossRef F.F. Csikor, C. Motz, D. Weygand, M. Zaiser, and S. Zapperi: Science, 2007, vol. 318, pp. 251-4.CrossRef
31.
go back to reference Z.W. Shan, R.K. Mishra, S.A. Syed Asif, O.L. Warren, and A.M. Minor: Nat. Mater., 2008, vol. 7, pp. 115-9.CrossRef Z.W. Shan, R.K. Mishra, S.A. Syed Asif, O.L. Warren, and A.M. Minor: Nat. Mater., 2008, vol. 7, pp. 115-9.CrossRef
32.
go back to reference M.C. Liu, C.J. Lee, Y.H. Lai, and J.C. Huang: Thin Solid Films 2010, vol. 518, pp. 7295-9.CrossRef M.C. Liu, C.J. Lee, Y.H. Lai, and J.C. Huang: Thin Solid Films 2010, vol. 518, pp. 7295-9.CrossRef
33.
go back to reference D.R.P. Singh, N. Chawla, G. Tang, and Y.L. Shen: Acta Mater., 2010, vol. 58, pp. 6628-36.CrossRef D.R.P. Singh, N. Chawla, G. Tang, and Y.L. Shen: Acta Mater., 2010, vol. 58, pp. 6628-36.CrossRef
Metadata
Title
Mechanical Behavior of Nano-crystalline Metallic Thin Films and Multilayers Under Microcompression
Authors
Jiangting Wang
Chunhui Yang
Peter D. Hodgson
Publication date
01-03-2015
Publisher
Springer US
Published in
Metallurgical and Materials Transactions A / Issue 3/2015
Print ISSN: 1073-5623
Electronic ISSN: 1543-1940
DOI
https://doi.org/10.1007/s11661-014-2715-1

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