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2012 | OriginalPaper | Chapter

4. Methods of Parameter Variations

Authors : Christoph Knoth, Ulf Schlichtmann, Bing Li, Min Zhang, Markus Olbrich, Emrah Acar, Uwe Eichler, Joachim Haase, André Lange, Michael Pronath

Published in: Process Variations and Probabilistic Integrated Circuit Design

Publisher: Springer New York

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Abstract

Chapter 4 presents various dedicated methods that support variability handling in the design process. Using these methods, the designer can analyze the effect of variations on his design and identify possible improvements.

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previous chapter Examination of Process Parameter Variations
next chapter Consequences for Circuit Design and Case Studies
Footnotes
1
Finding corner cases is nontrivial not only because of the large number of parameters. For some parameters, such as temperature, nonlinear dependencies have been observed [4].
 
2
Note that electrical characteristics such as Isat or transconductance gm are simulation results, but not parameters of a transistor model like BSIM3.
 
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Metadata
Title
Methods of Parameter Variations
Authors
Christoph Knoth
Ulf Schlichtmann
Bing Li
Min Zhang
Markus Olbrich
Emrah Acar
Uwe Eichler
Joachim Haase
André Lange
Michael Pronath
Copyright Year
2012
Publisher
Springer New York
Book
Process Variations and Probabilistic Integrated Circuit Design

Print ISBN: 978-1-4419-6620-9

Electronic ISBN: 978-1-4419-6621-6

Copyright Year: 2012

DOI
https://doi.org/10.1007/978-1-4419-6621-6_4