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Published in: Journal of Materials Science: Materials in Electronics 9/2014

01-09-2014

Microstructure and microwave dielectric properties of xSm(Mg0.5Ti0.5)O3–(1 − x)Ca0.8Sr0.2TiO3 ceramics

Authors: Lichun Yao, Tai Qiu, Wei Wan, Jian Yang

Published in: Journal of Materials Science: Materials in Electronics | Issue 9/2014

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Abstract

xSm(Mg0.5Ti0.5)O3–(1 − x)Ca0.8Sr0.2TiO3 (x = 0.50–0.95) ceramics are prepared by a conventional solid-state ceramic route. The microstructure and microwave dielectric properties are investigated as a function of the x-value and sintering temperature. The single phase solid solutions were obtained throughout the studied compositional range. The variation of bulk density and dielectric properties are related with the x-value. Increasing sintering temperature can effectively promote the densification and dielectric properties of xSm(Mg0.5Ti0.5)O3–(1 − x)Ca0.8Sr0.2TiO3 ceramic system. With the content of Sm(Mg0.5Ti0.5)O3 increasing, the temperature coefficient of resonant frequency τ f value decreased, and a near-zero τ f could be obtained for the samples with x = 0.80. The optimal microwave dielectric properties with a dielectric constant ε r of 30.1, Q × f of 115,000 GHz (at 8.0 GHz), and τ f of 8.9 ppm/°C were obtained for 0.80Sm(Mg0.5Ti0.5)O3–0.20Ca0.8Sr0.2TiO3 sintered at 1,550 °C for 3 h, which showed high density and well-developed grain growth.

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Metadata
Title
Microstructure and microwave dielectric properties of xSm(Mg0.5Ti0.5)O3–(1 − x)Ca0.8Sr0.2TiO3 ceramics
Authors
Lichun Yao
Tai Qiu
Wei Wan
Jian Yang
Publication date
01-09-2014
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 9/2014
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-014-2127-4

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