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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 11/2008

01-11-2008

Microstructure, dielectric and electromechanical properties of PLSZFT nanoceramics for piezoelectric applications

Authors: Koduri Ramam, Marta Lopez

Published in: Journal of Materials Science: Materials in Electronics | Issue 11/2008

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Abstract

This investigation highlights the influence of isovalent Sr2+ on acceptor Fe3+ modified PLZT for microstructure and its effect on dielectric and piezoelectric properties [Pb0.985−yLa0.015Sry][(Zr0.538Ti0.462)0.985Fe0.015]O3 where y = 0, 0.5, 1.0, and 1.5 mol% nanocrystalline solid solutions near morphotrophic phase boundary were synthesized by solid state reaction method. X-ray diffraction patterns indicated that Sr increment resulted in strong tetragonality. Grain size and apparent density enhanced up to y = 1.5 mol%. TEM studies indicated that average particle size ranged from 23 to 68 nm. PLSZFT compositions attained optimum εRT, d33, and kp at y = 1.5 mol%, respectively which could be suitable for possible piezoelectric applications. The influence of grain size on dielectric and piezoelectric properties are reported.
previous article Room temperature deposition and properties of ZnO:Al thin films by nonreactive DC magnetron sputtering

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Metadata
Title
Microstructure, dielectric and electromechanical properties of PLSZFT nanoceramics for piezoelectric applications
Authors
Koduri Ramam
Marta Lopez
Publication date
01-11-2008
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 11/2008
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-007-9492-1

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