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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 9/2011

01-09-2011

Microwave dielectric properties of novel rare earth based silicates: RE2Ti2SiO9 [RE = La, Pr and Nd]

Authors: Sherin Thomas, B. Sayoojyam, M. T. Sebastian

Published in: Journal of Materials Science: Materials in Electronics | Issue 9/2011

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Abstract

The RE2Ti2SiO9 [RE = La, Nd and Pr] ceramics are synthesized by solid state ceramic route. These materials exhibit a relative permittivity of about 30 with quality factor in the range 19,600–33,700 GHz. They also showed relatively low values of τf. The microwave dielectric properties of these materials are studied for the first time. The La2−xPrxTi2SiO9 [x = 0–2] based solid solution are also synthesized and single phase is confirmed over the whole composition range. The lattice parameters showed a linear variation with increasing x which can be well correlated with the ionic radius of the RE3+ ions.
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Metadata
Title
Microwave dielectric properties of novel rare earth based silicates: RE2Ti2SiO9 [RE = La, Pr and Nd]
Authors
Sherin Thomas
B. Sayoojyam
M. T. Sebastian
Publication date
01-09-2011
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 9/2011
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-011-0310-4

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