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Semiconductors
Published in: Semiconductors 5/2018

01-05-2018 | XXV International Symposium “Nanostructures: Physics and Technology”, Saint Petersburg, Russia, June 26–30, 2017. Nanostructure Characterization

Molecular Beam Epitaxy of Materials Interfaces with Atomic Precision

Author: K. H. Ploog

Published in: Semiconductors | Issue 5/2018

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previous article Dielectric Properties of Oligonucleotides on the Surface of Si Nanosandwich Structures
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Metadata
Title
Molecular Beam Epitaxy of Materials Interfaces with Atomic Precision
Author
K. H. Ploog
Publication date
01-05-2018
Publisher
Pleiades Publishing
Published in
Semiconductors / Issue 5/2018
Print ISSN: 1063-7826
Electronic ISSN: 1090-6479
DOI
https://doi.org/10.1134/S1063782618050238

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