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Published in: Journal of Materials Science: Materials in Electronics 1/2018

27-09-2017

Optical characterization of Eu3+ doped MLSiO4 (M = Ca, Sr, Ba and L = Mg) phosphor materials for display devices

Authors: Devender Singh, Suman Sheoran, Jasbir Singh

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2018

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Abstract

Mixed metal oxide based phosphors of Eu3+ doped MLSiO4 (M = Ca, Sr, Ba and L = Mg) type were explored using sol–gel process. Optical characteristics of different compositions of calcium magnesium silicate including CaMg(0.97)SiO4, Ca(0.97)MgSiO4 and Ca(0.985)Mg(0.985)SiO4 phosphor materials were investigated in detail prepared with 0.03 molar concentration of europium ion. Emission spectra of these materials presented dominant peak at 613 nm because of electric dipole (5D0 → 7F2) transition of Eu3+ ion. Red luminescence in the silicate phosphors was due to the presence of Eu3+ ion in their lattice. Effect of variation of metal ion (M = Ca, Sr and Ba) on the optical properties of MLSiO4 (L = Mg) materials was also explained in the present report. Particle size of the prepared materials was computed using Debye Scherrer’s equation from X-ray diffraction analysis. Different crystal structures were examined from diffraction pattern available for these materials. Chemical structure as well as bonding present in these phosphor materials was analyzed from Fourier Transform Infrared study. Microscopic tool including transmission electron microscope was applied to approximate the particle size of prepared materials. Excellent photoluminescence response and nanosize of these materials made them suitable in display device technology.

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Metadata
Title
Optical characterization of Eu3+ doped MLSiO4 (M = Ca, Sr, Ba and L = Mg) phosphor materials for display devices
Authors
Devender Singh
Suman Sheoran
Jasbir Singh
Publication date
27-09-2017
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-017-7916-0

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