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2015 | OriginalPaper | Chapter

60. Optimal Test Selection of Complex Electronic Systems Based on Improved Discrete Particle Swarm Optimization Algorithm

Authors : Ling Ma, Haijun Li, Xiaofeng Lv

Published in: Proceedings of the Second International Conference on Mechatronics and Automatic Control

Publisher: Springer International Publishing

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Abstract

Optimal test selection is the important content of complex electronic system testability design. This chapter establishes the mathematical model of optimal test selection and then proposes an improved discrete particle swarm optimization algorithm to provide a solution. The algorithm designs a new fitness function according to the characteristics of test selection. In order to avoid the local optimum, an inertia weight adaptive adjustment strategy based on the group’s premature degree is proposed. The simulation results show that the algorithm proposed can achieve a global optimal solution fast and effectively. Optimization results meet all system requirements and can provide an effective guidance for optimal test selection of complex electronic systems.

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Metadata
Title
Optimal Test Selection of Complex Electronic Systems Based on Improved Discrete Particle Swarm Optimization Algorithm
Authors
Ling Ma
Haijun Li
Xiaofeng Lv
Copyright Year
2015
Book
Proceedings of the Second International Conference on Mechatronics and Automatic Control

Print ISBN: 978-3-319-13706-3

Electronic ISBN: 978-3-319-13707-0

Copyright Year: 2015

DOI
https://doi.org/10.1007/978-3-319-13707-0_60