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Published in:
Fundamentals of Sputtering Read chapter Read first chapter

1984 | OriginalPaper | Chapter

Organic Secondary Ion Mass Spectrometry

Author : A. Benninghoven

Published in: Secondary Ion Mass Spectrometry SIMS IV

Publisher: Springer Berlin Heidelberg

Included in: Professional Book Archive

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Organic SIMS is based on the primarily unexpected fact that sputtering of even involatile and thermally labile organic molecules results in-the formation of parent-like secondary ions, as (M+H)+ and (M-H)-, e.g. [1–3]. In addition, characteristic fragment ions are generated.

previous chapter Investigation of Gas Phase Ions with a Quadrupole SIMS Instrument
next chapter Characteristics of Molecular Secondary Ion Mass Spectrometry
Metadata
Title
Organic Secondary Ion Mass Spectrometry
Author
A. Benninghoven
Copyright Year
1984
Publisher
Springer Berlin Heidelberg
Book
Secondary Ion Mass Spectrometry SIMS IV

Print ISBN: 978-3-642-82258-2

Electronic ISBN: 978-3-642-82256-8

Copyright Year: 1984

DOI
https://doi.org/10.1007/978-3-642-82256-8_91