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1984 | OriginalPaper | Chapter

Parameters Influencing Ion Intensities for Quadrupole SIMS Instruments

Authors : M. Kotera, D. B. Wittry

Published in: Secondary Ion Mass Spectrometry SIMS IV

Publisher: Springer Berlin Heidelberg

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It is well known that quadrupole mass spectrometers can be operated in various resolution modes, for example, constant ΔM or constant M/ΔM. This property is easy to understand theoretically from the stability diagram and from the equation for the scan line: (1) $${\rm{U = \alpha V}} \pm {\rm{\gamma }}$$ and the equation for the resolution: (2) $$\frac{{\rm{M}}}{{\Delta {\rm{M}}}} = \frac{{\rm{C}}}{{0.16784 - {\rm{U/V}}}}.$$ In these equations U and V are the d.c. and a.c. potentials aoplied to the electrodes, α and γ are constants determined by adjustments on the guadrupole control and C is a constant that depends on peak shape. From these equations and the fact that V is proportional to M,it can be seen that if α = 0.16784 and K ≠ 0 ΔM will be constant. Also if K = 0 and α ≠ 0.16784 M/ΔM will be constant.

Metadata
Title
Parameters Influencing Ion Intensities for Quadrupole SIMS Instruments
Authors
M. Kotera
D. B. Wittry
Copyright Year
1984
Publisher
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-82256-8_43