Skip to main content
Top
Published in: Metallurgical and Materials Transactions A 7/2009

01-07-2009

Probing Phase Evolution Behavior during Nanocrystallization of Metallic Glass Using Positron Annihilation Spectroscopy

Authors: A. P. Srivastava, D. Srivastava, G. K. Dey, K. Sudarshan, P. K. Pujari

Published in: Metallurgical and Materials Transactions A | Issue 7/2009

Log in

Activate our intelligent search to find suitable subject content or patents.

search-config
loading …

Abstract

Positron annihilation lifetime spectroscopy and coincidence Doppler broadening (CDB) techniques have been used to study the nanocrystallization behavior of soft magnetic materials, using Metglas 2826MB as an example. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) characterization techniques revealed the presence of two phases, γ-(Fe,Ni) and (Fe,Ni,Mo)23B6, as well as the size and volume fraction of the phases following predetermined thermal annealing. Two distinct positron lifetime components have been observed in both amorphous and nanocrystallized samples. In the nanocrystallized samples, it has been demonstrated unambiguously that small and large lifetime components were due to positron annihilation with crystalline nanophases and with amorphous-crystalline or intercrystalline interfaces, respectively. First-principle calculation of the positron lifetime and electron momentum distribution in crystalline phases, supplemented by TEM and XRD studies, helped in the unambiguous interpretation of the experimental observation. This study throws new insights into positron behavior in metallic glasses, especially in the presence of single or multiple nanophases embedded in the amorphous matrix.

Dont have a licence yet? Then find out more about our products and how to get one now:

Springer Professional "Wirtschaft+Technik"

Online-Abonnement

Mit Springer Professional "Wirtschaft+Technik" erhalten Sie Zugriff auf:

  • über 102.000 Bücher
  • über 537 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Finance + Banking
  • Management + Führung
  • Marketing + Vertrieb
  • Maschinenbau + Werkstoffe
  • Versicherung + Risiko

Jetzt Wissensvorsprung sichern!

Springer Professional "Technik"

Online-Abonnement

Mit Springer Professional "Technik" erhalten Sie Zugriff auf:

  • über 67.000 Bücher
  • über 390 Zeitschriften

aus folgenden Fachgebieten:

  • Automobil + Motoren
  • Bauwesen + Immobilien
  • Business IT + Informatik
  • Elektrotechnik + Elektronik
  • Energie + Nachhaltigkeit
  • Maschinenbau + Werkstoffe




 

Jetzt Wissensvorsprung sichern!

Footnotes
1
FINEMET is a registered trademark of Hitachi Metals, Ltd., Arlington Heights, IL.
 
2
NANOPERM is a registered trademark of MAGNETEC GmbH, Langenselbold, Germany.
 
3
PHILIPS is a trademark of Philips Electronic Instruments Corp., Mahwah, NJ.
 
4
JEOL is a trademark of Japan Electron Optics Ltd., Tokyo.
 
Literature
2.
go back to reference W. Brandt and A. Dupasquier: Positron Solid State Physics, North-Holland, Amsterdam, 1984, pp. 1–228. W. Brandt and A. Dupasquier: Positron Solid State Physics, North-Holland, Amsterdam, 1984, pp. 1–228.
3.
go back to reference K.P. Gopinathan and C.S. Sundar: in Metallic Glasses: Production, Properties and Applications, T.R. Anantharaman, ed., Trans Tech Publications, Stafa-Zurich, Switzerland, 1984, pp. 115–46. K.P. Gopinathan and C.S. Sundar: in Metallic Glasses: Production, Properties and Applications, T.R. Anantharaman, ed., Trans Tech Publications, Stafa-Zurich, Switzerland, 1984, pp. 115–46.
5.
go back to reference Z. Michno and T. Gorecki: Proc. Int. Positron Workshop, Peter Sperr and Gotteried Kogel, eds., Universitat der bundeswehr, Munchen, 1988, p. 61. Z. Michno and T. Gorecki: Proc. Int. Positron Workshop, Peter Sperr and Gotteried Kogel, eds., Universitat der bundeswehr, Munchen, 1988, p. 61.
6.
go back to reference A. Dupasquir, G. Kogel, and A. Somaza: Acta Mater., 2004, vol. 52, pp. 4707–26.CrossRef A. Dupasquir, G. Kogel, and A. Somaza: Acta Mater., 2004, vol. 52, pp. 4707–26.CrossRef
8.
go back to reference C. Nagel, K. Rätzke, E. Schmidtke, and J. Wolff: Phys. Rev. B, 1998, vol. 57, pp. 10224–27.CrossRefADS C. Nagel, K. Rätzke, E. Schmidtke, and J. Wolff: Phys. Rev. B, 1998, vol. 57, pp. 10224–27.CrossRefADS
9.
go back to reference P. Asoka Kumar, M. Alatalo, V.J. Ghosh, A.C. Kruseman, B. Nielsen, and K.G. Lynn: Phys. Rev. Lett., 1996, vol. 77, pp. 2097–2100.PubMedCrossRefADS P. Asoka Kumar, M. Alatalo, V.J. Ghosh, A.C. Kruseman, B. Nielsen, and K.G. Lynn: Phys. Rev. Lett., 1996, vol. 77, pp. 2097–2100.PubMedCrossRefADS
10.
go back to reference Y. Nagai, K. Takadate, Z. Tang, H. Ohkubo, H. Sunaga, H. Takizawa, and M. Hasegawa: Phys. Rev. B, 2003, vol. 67, pp. 224202:1–224202:6.CrossRefADS Y. Nagai, K. Takadate, Z. Tang, H. Ohkubo, H. Sunaga, H. Takizawa, and M. Hasegawa: Phys. Rev. B, 2003, vol. 67, pp. 224202:1–224202:6.CrossRefADS
11.
go back to reference P.P. Chattopadhyay, P.M.G. Nambissan, K. Pabi, and I. Manna: Phys. Rev. B, 2001, vol. 63, pp. 054107:1–054107:7.ADS P.P. Chattopadhyay, P.M.G. Nambissan, K. Pabi, and I. Manna: Phys. Rev. B, 2001, vol. 63, pp. 054107:1–054107:7.ADS
12.
go back to reference R. Würschum, E. Shapiro, R. Dittmar, and H.-E. Schaefer: Phys. Rev. B, 2000, vol. 62, pp. 12021–27.CrossRefADS R. Würschum, E. Shapiro, R. Dittmar, and H.-E. Schaefer: Phys. Rev. B, 2000, vol. 62, pp. 12021–27.CrossRefADS
13.
14.
go back to reference X.Y. Zhang, Y. Guan, J.W. Zhang, W. Sprengel, K.J. Reichle, K. Blaurock, K. Reimann, and H.-E. Schaefer: Phys. Rev. B, 2002, vol. 66, pp. 212103:1–212103:4.ADS X.Y. Zhang, Y. Guan, J.W. Zhang, W. Sprengel, K.J. Reichle, K. Blaurock, K. Reimann, and H.-E. Schaefer: Phys. Rev. B, 2002, vol. 66, pp. 212103:1–212103:4.ADS
16.
go back to reference W. Lu, L. Yang, B. Yan, and W.-H. Huang: Mater. Sci. Eng., B, 2006, vol. 128, pp. 179–83.CrossRef W. Lu, L. Yang, B. Yan, and W.-H. Huang: Mater. Sci. Eng., B, 2006, vol. 128, pp. 179–83.CrossRef
17.
18.
go back to reference M. Miglierini, T. Kanuch, M. Pavuk, and V. Slugen: J. Magn. Magn. Mater., 2006, vol. 304, pp. e666–e668.CrossRefADS M. Miglierini, T. Kanuch, M. Pavuk, and V. Slugen: J. Magn. Magn. Mater., 2006, vol. 304, pp. e666–e668.CrossRefADS
19.
go back to reference F.M. McHenry, M.A. Willard, and D.E. Laughlin: Prog. Mater. Sci., 1999, vol. 44, pp. 291–433.CrossRef F.M. McHenry, M.A. Willard, and D.E. Laughlin: Prog. Mater. Sci., 1999, vol. 44, pp. 291–433.CrossRef
20.
22.
go back to reference G. Herzer: Handbook of Magnetic Materials, Elsevier Science, Amsterdam, 1997, vol. 10, p. 415. G. Herzer: Handbook of Magnetic Materials, Elsevier Science, Amsterdam, 1997, vol. 10, p. 415.
24.
go back to reference J.S. Blázquez, S. Roth, C. Mickel, and A. Conde: Acta Mater., 2005, vol. 53, pp. 1241–51.CrossRef J.S. Blázquez, S. Roth, C. Mickel, and A. Conde: Acta Mater., 2005, vol. 53, pp. 1241–51.CrossRef
25.
go back to reference B.D. Cullity: Elements of X-Ray Diffraction, Addison-Wesley Publication Company, Inc., Menlo Park, CA, p. 284. B.D. Cullity: Elements of X-Ray Diffraction, Addison-Wesley Publication Company, Inc., Menlo Park, CA, p. 284.
26.
go back to reference K.P. Mizgalski, O.T. Inal, F.G. Yost, and M.M. Karnowasky: J. Mater. Sci., 1981, vol. 16, pp. 3357–64.CrossRefADS K.P. Mizgalski, O.T. Inal, F.G. Yost, and M.M. Karnowasky: J. Mater. Sci., 1981, vol. 16, pp. 3357–64.CrossRefADS
27.
go back to reference M. Alatalo, H. Kauppinen, K. Saarinen, M.J. Puska, J. Makinen, P. Hautojarvi, and R.M. Nieminen: Phys. Rev. B, 1995, vol. 51, pp. 4176–85.CrossRefADS M. Alatalo, H. Kauppinen, K. Saarinen, M.J. Puska, J. Makinen, P. Hautojarvi, and R.M. Nieminen: Phys. Rev. B, 1995, vol. 51, pp. 4176–85.CrossRefADS
29.
go back to reference M. Heiskanen, T. Torsti, M.J. Puska, and R.M. Nieminen: Phys. Rev. B, 2001, vol. 63, pp. 245106:1–245106:8.CrossRefADS M. Heiskanen, T. Torsti, M.J. Puska, and R.M. Nieminen: Phys. Rev. B, 2001, vol. 63, pp. 245106:1–245106:8.CrossRefADS
30.
go back to reference A.P. Srivastava, D. Srivastava, and G.K. Dey: J. Magn. Magn. Mater., 2006, vol. 306, pp. 147–55.CrossRefADS A.P. Srivastava, D. Srivastava, and G.K. Dey: J. Magn. Magn. Mater., 2006, vol. 306, pp. 147–55.CrossRefADS
Metadata
Title
Probing Phase Evolution Behavior during Nanocrystallization of Metallic Glass Using Positron Annihilation Spectroscopy
Authors
A. P. Srivastava
D. Srivastava
G. K. Dey
K. Sudarshan
P. K. Pujari
Publication date
01-07-2009
Publisher
Springer US
Published in
Metallurgical and Materials Transactions A / Issue 7/2009
Print ISSN: 1073-5623
Electronic ISSN: 1543-1940
DOI
https://doi.org/10.1007/s11661-009-9832-2

Other articles of this Issue 7/2009

Metallurgical and Materials Transactions A 7/2009 Go to the issue

Premium Partners