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Published in: Journal of Materials Science: Materials in Electronics 2/2016

31-10-2015

Properties of spray deposited Zn, Mg incorporated CdO thin films

Published in: Journal of Materials Science: Materials in Electronics | Issue 2/2016

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Abstract

Undoped CdO film and CdO films which are alloyed with Zn and Mg (ZMCO) at different concentrations were prepared by spray pyrolysis technique using perfume atomizer on glass substrates kept at 400 °C. The effect of Zn, Mg incorporation on the structural, morphological, optical and electrical properties of the CdO films were investigated using X-ray diffraction (XRD), scanning electron microscopy, UV–Vis spectroscopy and dc electrical measurements respectively. XRD analysis showed that all the alloyed films exhibit polycrystalline nature having cubic crystal structure with a (1 1 1) preferential orientation similar to that of the undoped sample. All the Zn, Mg incorporated CdO films have good transparency in the visible region. Optical band gap is blue shifted with increasing Zn, Mg concentration. Electrical studies showed that the ZMCO film coated with 6 at.% Zn, Mg concentration exhibit a minimum resistivity of 0.724 × 10−4 Ω-cm. The high transparency, widened band gap energy and improved electrical properties obtained infer that ZMCO thin films find applications in optoelectronic devices, especially in solar cells.

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Footnotes
1
The slight contraction in the lattice parameter values observed for the co-doped films is due to the decrease in their interatomic spacing values which results from the substitution of smaller Zn2+ (0.60 Å) and Mg2+ (0.72 Å) ions in larger Cd2+ ions (0.97 Å). The observed slight shift of the (1 1 1) diffraction peak towards higher Bragg angle (Fig. 2) strongly favors for this lattice contraction. The contraction of lattice parameter and shifting of the XRD (1 1 1) reflection to higher 2θ values with increasing concentration of Zn, Mg strongly favors for the successful incorporation of Zn2+ and Mg2+ ions in the CdO lattice. Generally, the lattice parameters of a semiconductor depend on: (1) free electron concentration (2) concentration of foreign atoms and defects and their difference in ionic radii with respect to the substituted matrix ion, (3) external strains those induced by the substrate and (4) temperature effect [14].
 
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Metadata
Title
Properties of spray deposited Zn, Mg incorporated CdO thin films
Publication date
31-10-2015
Published in
Journal of Materials Science: Materials in Electronics / Issue 2/2016
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-3993-0

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