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Published in: Wireless Personal Communications 1/2022

24-02-2022

RL-BLED: A Reversible Logic Design of Bit Level Encryption/Decryption Algorithm for Secure Mammogram Data Transmission

Authors: M. N. Sharada Guptha, M. N. Eshwarappa

Published in: Wireless Personal Communications | Issue 1/2022

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Abstract

Security is an essential task while focusing on confidential level of patient information during medical data transmission. The image encryption algorithms that considered bit-level permutation can provide better security by changing the position of the pixels concurrently. But these encryption algorithms consume more power and area while implementing it on FPGA for securing the mammographic images based on irreversible logic or conventional gate circuits. Instead, the reversible logic gates can save the power and increase the speed of computation. This work proposed a new bit level image encryption and decryption circuit using reversible logic gates (RL-BLED). The proposed encryption module contains key generation unit, diffusion unit and confusion unit. It used reversible logic (RL) gates for diffusing the binary sequences and permuting the bitplanes in the confusion phase based on the key generated using reversible chaotic sequence generator module. Each unit of the proposed RL-BLED depends on numerous reversible sub-modules including adders, rotators, multipliers, modulo operators, dividers and so on. Here, the quantum cost, garbage outputs, delay and power of each sub-modules are analysed for demonstrating the effectiveness of the RL-BLED structure. The simulation results illustrate that the suggested RL-BLED overtakes the existing models in terms of LUTs, slices, flip flops and frequency.

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Metadata
Title
RL-BLED: A Reversible Logic Design of Bit Level Encryption/Decryption Algorithm for Secure Mammogram Data Transmission
Authors
M. N. Sharada Guptha
M. N. Eshwarappa
Publication date
24-02-2022
Publisher
Springer US
Published in
Wireless Personal Communications / Issue 1/2022
Print ISSN: 0929-6212
Electronic ISSN: 1572-834X
DOI
https://doi.org/10.1007/s11277-022-09584-3

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