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2014 | OriginalPaper | Chapter

Statistical Compact Model Extraction for Skewed Gaussian Variations

Authors : V. Janakiraman, Shrinivas J. Pandharpure, Josef Watts

Published in: Physics of Semiconductor Devices

Publisher: Springer International Publishing

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A technique for extracting Statistical Compact Model (SCM) parameters for skewed Gaussian parameters is proposed. Existing techniques handle non-Gaussian variations through non-linearity in model equations. However, hardware data on certain technologies suggest that non-Gaussian variations are observed even on linear parameters like Idlin/Idsat. We propose to model such variations through skewed Gaussian random variables. Analytical expressions for the statistics of the skewed Gaussian process and performance parameters are derived. SCM parameters are extracted by setting up a skewed back propagation of variance (SBPV) algorithm.

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Metadata
Title
Statistical Compact Model Extraction for Skewed Gaussian Variations
Authors
V. Janakiraman
Shrinivas J. Pandharpure
Josef Watts
Copyright Year
2014
Publisher
Springer International Publishing
Book
Physics of Semiconductor Devices

Print ISBN: 978-3-319-03001-2

Electronic ISBN: 978-3-319-03002-9

Copyright Year: 2014

DOI
https://doi.org/10.1007/978-3-319-03002-9_51