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Published in: Journal of Materials Science: Materials in Electronics 5/2013

01-05-2013

Structural and dielectric studies of Eu3+/Ag nanocrystallites: SiO2–TiO2 matrices

Authors: K. V. Arun Kumar, Sunil Thomas, Manju Gopinath, P. R. Biju, N. V. Unnikrishnan

Published in: Journal of Materials Science: Materials in Electronics | Issue 5/2013

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Abstract

Silver nanocrystallites/Eu3+ doped SiO2–TiO2 matrices were synthesised through sol–gel route and the structural and dielectric properties of the matrices were studied. Structural characterizations were done using EDX, XRD, FTIR, AFM and TEM measurements. The TEM and XRD measurements confirm the presence of Ag and TiO2 nanocrystals. The dielectric and electrical conductivity studies of the samples were done for a frequency range of 100 Hz–2 MHz. The conductivity variation with the Ag content in the Eu3+ doped SiO2–TiO2 system has been explained by correlating the presence of ionic contribution to the electrical conductivity process. Also, the frequency dependence of dielectric constant and conductivity were studied. The Cole–Cole parameters were calculated and the semicircles observed in the plots indicate a single relaxation process. This behaviour can be modelled by an equivalent parallel RC circuit.

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Metadata
Title
Structural and dielectric studies of Eu3+/Ag nanocrystallites: SiO2–TiO2 matrices
Authors
K. V. Arun Kumar
Sunil Thomas
Manju Gopinath
P. R. Biju
N. V. Unnikrishnan
Publication date
01-05-2013
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 5/2013
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-012-1005-1

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