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1984 | OriginalPaper | Chapter

Structural Characterization of Naturally Occurring Oligosaccharides by Matrix-Assisted Molecular Secondary Ion Mass Spectrometry

Authors : M. Suzuki, K.-I. Harada, A. Tatematsu, H. Kambara

Published in: Secondary Ion Mass Spectrometry SIMS IV

Publisher: Springer Berlin Heidelberg

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Normally, a glycerol matrix is essential in sputtered ion mass spectrometry such as fast atom bombardment (FAB) and molecular secondary ion mass spectrometry (SIMS) [1]. Recently, we have successfully applied an amine matrix, diethanolamine (DEA) and triethanolamine (TEA), instead of glycerol for the determination of molecular weight of neutral oligosaccharides by molecular SIMS [2]. When DEA was used, a stable molecular adduct ion species, the [M+DEAH]+ ion, was formed as the sole ion derived from a neutral saccharide molecule and no fragment ions were detected. Moreover, the [M+DEAH]+ ion scarcely decomposed even under collisionally activated dissociation (CAD) conditions.

Metadata
Title
Structural Characterization of Naturally Occurring Oligosaccharides by Matrix-Assisted Molecular Secondary Ion Mass Spectrometry
Authors
M. Suzuki
K.-I. Harada
A. Tatematsu
H. Kambara
Copyright Year
1984
Publisher
Springer Berlin Heidelberg
DOI
https://doi.org/10.1007/978-3-642-82256-8_109