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Published in: Journal of Materials Science: Materials in Electronics 10/2017

07-03-2017

Structural, electrical, and photoluminescence properties of Pr3+ doped Na0.25K0.25Bi2.5Nb2O9 bismuth layer-structure ceramics

Authors: Yuhan Luo, Xiangping Jiang, Chao Chen, Yunjing Chen, Na Tu, Xiang Xia, Yalin Jiang

Published in: Journal of Materials Science: Materials in Electronics | Issue 10/2017

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Abstract

In this paper, Pr3+ doped Na0.25K0.25Bi2.5Nb2O9 (NKBN-xPr3+) ceramics were successfully prepared via a conventional solid-state reaction process. The structural, dielectric, and piezoelectric properties as well as photoluminescence performance of the samples were systemically studied. All the ceramic samples possessed a pure two-layered bismuth layer-structure with the A2 1 am space group. Raman spectra revealed that the doped Pr3+ ions mainly replaced Bi3+ at the A-sites in the pseudo-perovskite layers. With increasing Pr3+ concentration, the Curie temperature and the maximum dielectric constant of the samples decreased, while the piezoelectric constant d 33 increased from 15 pC/N for x = 0 to 21 pC/N for x = 0.01. Addition, d 33 remained almost unchanged for all samples when the annealing temperature was lower than 450 °C. Under excitation with 452 nm light, the obtained samples exhibited a typical emission of Pr3+ ions, with the strongest red emission peak centered at 609 nm. The corresponding color tone of the ceramics shifted from red-orange to orange-yellow with increasing Pr3+ doping. The thermal quenching behavior of the photoluminescence of the x = 0.01 sample was also investigated in detail, and the thermal quenching activation energy was calculated to be 0.4473 eV. Our study indicated that NKBN-xPr3+ ceramics may have potential applications in multi-functional devices.

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Metadata
Title
Structural, electrical, and photoluminescence properties of Pr3+ doped Na0.25K0.25Bi2.5Nb2O9 bismuth layer-structure ceramics
Authors
Yuhan Luo
Xiangping Jiang
Chao Chen
Yunjing Chen
Na Tu
Xiang Xia
Yalin Jiang
Publication date
07-03-2017
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 10/2017
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-017-6442-4

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