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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 12/2018

04-04-2018

Structural, optical and electrical properties of pure and Fe doped V2O5 nanoparticles for junction diode fabrications

Authors: I. Pradeep, E. Ranjith Kumar, N. Suriyanaranan, Ch. Srinivas, N. Venkata Rao

Published in: Journal of Materials Science: Materials in Electronics | Issue 12/2018

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Abstract

Structural, optical and electrical studies of V2O5 and FexV2O5 (x = 5%) nanostructures synthesized by a wet chemical method have been reported. The synthesized nanostructures were characterized by XRD, SEM–EDX, HRTEM, XPS, UV(DRS), FT-IR, PL, TG–DTA, AC and DC conductivity study’s. The anorthic phase was observed in the XRD patterns of undoped and Fe doped samples which are prepared at low temperature. This anorthic phase was reduced with the heat treatment and gradually transformed into orthorhombic phase in the samples annealed at 600 °C for 1 h. The change in the surface morphology in the present samples from micro-rod to nanorods network seems to be dependent on the substitution of Fe. As observed from the PL analysis that the ultraviolet (UV) emission intensity was found to be decreased and exhibited a blue shift with the increase of Fe concentration. The analysis of AC and DC conductivity measurements recorded at room temperature in the temperature range of 303–403 K, revealed that the activation energy is high for Fe doped V2O5 compared to undoped V2O5. The junction diodes of n-V2O5/p-Si and V2O5:Fe/p-Si was successfully prepared by the nebulizer spray pyrolysis method. The (I–V) characteristics of nonlinear and asymmetric nature revealed the Schottky diode based behavior for pure and doped samples.
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Metadata
Title
Structural, optical and electrical properties of pure and Fe doped V2O5 nanoparticles for junction diode fabrications
Authors
I. Pradeep
E. Ranjith Kumar
N. Suriyanaranan
Ch. Srinivas
N. Venkata Rao
Publication date
04-04-2018
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 12/2018
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-018-9024-1

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