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Journal of Materials Science: Materials in Electronics
Published in: Journal of Materials Science: Materials in Electronics 6/2015

01-06-2015

Structure and dielectric properties of (Na0.5Bi0.5)TiO3–SrTiO3 thick films derived from polyvinylpyrrolidone-modified chemical solution

Authors: Zisheng Xu, Xihong Hao, Shengli An

Published in: Journal of Materials Science: Materials in Electronics | Issue 6/2015

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Abstract

In this work, 1.5-μm (1 − x%)(Na0.5Bi0.5)TiO3–x%SrTiO3 (abbreviated as NBT–xST, x = 0, 5, 10, 30 and 50) thick films were successfully fabricated on LaNiO3/Si (100) substrate by using a polyvinylpyrrolidone-modified chemical solution route. The effects of the substitution of ST on the microstructure and dielectric properties of the thick films were investigated in detail. It was found that the addition of ST could enhance the dielectric tunable properties and decrease the dielectric losses. The dielectric tunability for all the samples was higher than 30 %, and the maximum value of about 53 % was obtained in NBT–30ST film. Moreover, the substitution of ST improved the value of figure of merit of the thick film. These results indicate that NBT–ST thick films might be one of the promising environmentally friendly lead-free materials for dielectric tunable capacitor applications.
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Metadata
Title
Structure and dielectric properties of (Na0.5Bi0.5)TiO3–SrTiO3 thick films derived from polyvinylpyrrolidone-modified chemical solution
Authors
Zisheng Xu
Xihong Hao
Shengli An
Publication date
01-06-2015
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 6/2015
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-015-2985-4

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