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Published in: Journal of Materials Science: Materials in Electronics 1/2017

02-09-2016

Studies of physical properties of the Al doped ZnS thin films prepared by Spray

Authors: N. Bitri, K. Ben Bacha, Isabelle Ly, H. Bouzouita, M. Abaab

Published in: Journal of Materials Science: Materials in Electronics | Issue 1/2017

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Abstract

Undoped and Al doped ZnS were prepared via an efficient and low cost chemical co-precipitation method using Spray. In the present we study effect of Al concentration on structural, optical and electrical properties is studied using X-ray diffraction (XRD), the UV–visible, Fourier transform infrared spectroscopy and the impedance analyzer. The XRD shows that crystalline sizes which are in the range 22–59 nm which it increases with the highest values of Aluminium concentration. The optical measurements revealed that as the ZnS undoped and Al doping ZnS concentration increases the band gap decreases in the range of 3.72 to 3.61 eV thereby improving the optical properties of the ZnS thin film. Then, the impedance analyzer indicate firstly that the conductivity increase with the increasing of the doping concentration, the temperature and the frequency. On the other hand, the calculated values of the activation energy decrease with increasing of concentration of Al doping.

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Literature
1.
go back to reference X. Tang, E.S.G. Choo, L. Li, J. Ding, J. Xue, Chem. Mater. 22, 3383–3388 (2010)CrossRef X. Tang, E.S.G. Choo, L. Li, J. Ding, J. Xue, Chem. Mater. 22, 3383–3388 (2010)CrossRef
2.
go back to reference L. Jiang, G. Sun, Z. Zhou, S. Sun, Q. Wang, S. Yan, H. Li, J. Tian, J. Guo, B. Zhou, Q. Xin, J. Phys. Chem. B 109, 8774–8778 (2005)CrossRef L. Jiang, G. Sun, Z. Zhou, S. Sun, Q. Wang, S. Yan, H. Li, J. Tian, J. Guo, B. Zhou, Q. Xin, J. Phys. Chem. B 109, 8774–8778 (2005)CrossRef
4.
go back to reference Z. Yang, D. Gao, Z. Zhu, J. Zhang, Z. Shi, Z. Zhang, D. Xue, Nanoscale Res. Lett. 8, 1–9 (2013)CrossRef Z. Yang, D. Gao, Z. Zhu, J. Zhang, Z. Shi, Z. Zhang, D. Xue, Nanoscale Res. Lett. 8, 1–9 (2013)CrossRef
5.
go back to reference C.C. Uhuegbu, E.B. Babatunde, Am. J. Sci. Indus. Res. 1, 397 (2010) C.C. Uhuegbu, E.B. Babatunde, Am. J. Sci. Indus. Res. 1, 397 (2010)
6.
8.
9.
go back to reference L. Qi, X. Gu, M. Grujicic, W.G. Samuels, G.J. Exarhos, Appl. Phys. Lett. 83, 1136 (2003)CrossRef L. Qi, X. Gu, M. Grujicic, W.G. Samuels, G.J. Exarhos, Appl. Phys. Lett. 83, 1136 (2003)CrossRef
10.
go back to reference M.A. Hernández-Fenollosa, M.C. López, V. Donderis, M. González, B. Marí, J.R. Ramos-Barrado, Thin Solid Films 516, 1622–1625 (2008)CrossRef M.A. Hernández-Fenollosa, M.C. López, V. Donderis, M. González, B. Marí, J.R. Ramos-Barrado, Thin Solid Films 516, 1622–1625 (2008)CrossRef
11.
go back to reference T.B. Nasr, N. Kamoun, M. Kanzari, R. Bennaceur, Thin Solid Films 500, 4–8 (2006)CrossRef T.B. Nasr, N. Kamoun, M. Kanzari, R. Bennaceur, Thin Solid Films 500, 4–8 (2006)CrossRef
12.
go back to reference B.D. Cullity, Elements of X-ray diffraction (Addison-Wesle Publishing Company, Boston, 1978) B.D. Cullity, Elements of X-ray diffraction (Addison-Wesle Publishing Company, Boston, 1978)
14.
go back to reference M. Ahmad, E. Ahmed, Y. Zhang, N.R. Khalid, J. Xu, M. Ullah, Z. Hong, Curr. Appl. Phys. 13, 697–704 (2013)CrossRef M. Ahmad, E. Ahmed, Y. Zhang, N.R. Khalid, J. Xu, M. Ullah, Z. Hong, Curr. Appl. Phys. 13, 697–704 (2013)CrossRef
15.
go back to reference K.J. Chen, T.H. Fang, F.Y. Hung, L.W. Ji, S.J. Chang, S.J. Young, Y.J. Hsiao, Appl. Surf. Sci. 254, 5791–5795 (2008)CrossRef K.J. Chen, T.H. Fang, F.Y. Hung, L.W. Ji, S.J. Chang, S.J. Young, Y.J. Hsiao, Appl. Surf. Sci. 254, 5791–5795 (2008)CrossRef
16.
go back to reference D.A. Reddy, C. Liu, R.P. Vijayalakshmi, B.K. Reddy, J. Alloys Compd. 582(2014), 257–264 (2014)CrossRef D.A. Reddy, C. Liu, R.P. Vijayalakshmi, B.K. Reddy, J. Alloys Compd. 582(2014), 257–264 (2014)CrossRef
17.
go back to reference K. Nagamani, N. Revathi, P. Prathap, Y. Lingappa, K.T. Ramakrishna Reddy, Curr. Appl. Phys. 12, 380–384 (2012)CrossRef K. Nagamani, N. Revathi, P. Prathap, Y. Lingappa, K.T. Ramakrishna Reddy, Curr. Appl. Phys. 12, 380–384 (2012)CrossRef
18.
go back to reference H.T. Grahn, Introduction to Semiconductor Physics (World Scientific Publishing, Singapore, 1999)CrossRef H.T. Grahn, Introduction to Semiconductor Physics (World Scientific Publishing, Singapore, 1999)CrossRef
19.
go back to reference N. Kılınc, S. Ozturk, L. Arda, A. Altındal, Z.Z. Ozturk, J. Alloys Compd. 536, 138–144 (2012)CrossRef N. Kılınc, S. Ozturk, L. Arda, A. Altındal, Z.Z. Ozturk, J. Alloys Compd. 536, 138–144 (2012)CrossRef
20.
go back to reference R. Ondo-Ndong, G. Ferblantier, F. Pascal-Delannoy, A. Boyer, A. Foucaran, Microelectron. J. 34, 1087–1092 (2003)CrossRef R. Ondo-Ndong, G. Ferblantier, F. Pascal-Delannoy, A. Boyer, A. Foucaran, Microelectron. J. 34, 1087–1092 (2003)CrossRef
21.
go back to reference Takahiro. Nagata, Tamaki. Shimura, Atsushi. Ashida, Norifumi. Fujimura, Taichiro. Ito, J. Cryst. Growth 237–239, 533–537 (2002)CrossRef Takahiro. Nagata, Tamaki. Shimura, Atsushi. Ashida, Norifumi. Fujimura, Taichiro. Ito, J. Cryst. Growth 237–239, 533–537 (2002)CrossRef
Metadata
Title
Studies of physical properties of the Al doped ZnS thin films prepared by Spray
Authors
N. Bitri
K. Ben Bacha
Isabelle Ly
H. Bouzouita
M. Abaab
Publication date
02-09-2016
Publisher
Springer US
Published in
Journal of Materials Science: Materials in Electronics / Issue 1/2017
Print ISSN: 0957-4522
Electronic ISSN: 1573-482X
DOI
https://doi.org/10.1007/s10854-016-5584-0

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